Novel Low-Power and Highly Reliable Radiation Hardened Memory Cell for 65 nm CMOS Technology.
Jing GuoLiyi XiaoZhigang MaoPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2014)
Keyphrases
- cmos technology
- highly reliable
- low power
- power dissipation
- power consumption
- low cost
- high speed
- low voltage
- single chip
- embedded dram
- image sensor
- x ray
- low power consumption
- digital signal processing
- nm technology
- mixed signal
- random access memory
- power management
- power reduction
- digital camera
- main memory
- silicon on insulator