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Soft Error Hardened Memory Design for Nanoscale Complementary Metal Oxide Semiconductor Technology.
Jing Guo
Liyi Xiao
Tianqi Wang
Shanshan Liu
Xu Wang
Zhigang Mao
Published in:
IEEE Trans. Reliab. (2015)
Keyphrases
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metal oxide semiconductor
low cost
integrated circuit
embedded dram
case study
design process
signal processing
real time
data processing