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Soft Error Hardened Memory Design for Nanoscale Complementary Metal Oxide Semiconductor Technology.

Jing GuoLiyi XiaoTianqi WangShanshan LiuXu WangZhigang Mao
Published in: IEEE Trans. Reliab. (2015)
Keyphrases
  • metal oxide semiconductor
  • low cost
  • integrated circuit
  • embedded dram
  • case study
  • design process
  • signal processing
  • real time
  • data processing