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Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern.
Hong Zhang
Huaguo Liang
Jiewen Hu
Zhiwei Shao
Maoxiang Yi
Yingchun Lu
Zhengfeng Huang
Published in:
Microelectron. J. (2023)
Keyphrases
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automatic detection
test cases
learning algorithm
decision trees
process model
pattern matching
neural network
association rules
pattern detection
detection accuracy
design process
significant improvement
object recognition
training data
image segmentation
information systems
information retrieval
machine learning