PATTERN DETECTION
Experts
- Kou-Yuan Huang
- Jean-Luc Baril
- Yann-Gaël Guéhéneuc
- Eduardo B. Fernández
- Hazem M. El-Bakry
- Amedeo Napoli
- Daniel B. Neill
- Francesca Arcelli Fontana
- Marco Zanoni
- Irith Pomeranz
- U. Rajendra Acharya
- Sergey Kirgizov
- Jun Miura
- Andrew K. C. Wong
- Sudhakar M. Reddy
- Miklós Bóna
- Kai-Ju Chen
- Ying-Liang Chou
- Mohammad Zulkernine
- Toufik Mansour
- Sergei O. Kuznetsov
- Skyler Speakman
- Sergey Kitaev
- Luca Ferrari
- Vassilios Tzerpos
- Anders Claesson
- Michael H. Albert
- Adriano Camps
- Elke A. Rundensteiner
- Günter Kniesel
- Francesca Arcelli
- Einar Steingrímsson
- Ilyas Khan
- Naouel Moha
- Reda Alhajj
- Kewal K. Saluja
- Hong Zhang
- Yang Yang
- Mohammad Tehranipoor
Venues
- CoRR
- EuroPLoP
- Electron. J. Comb.
- Sensors
- IEEE Access
- Discret. Math.
- Remote. Sens.
- ITC
- IJCNN
- ICPR
- Pattern Recognit. Lett.
- EMBC
- IGARSS
- Pattern Recognit.
- ICASSP
- IEEE Trans. Computers
- Symmetry
- NeuroImage
- J. Comb. Theory, Ser. A
- CVPR
- Theor. Comput. Sci.
- Bioinform.
- Neurocomputing
- Eur. J. Comb.
- DAC
- SAC
- Asian Test Symposium
- IEEE Trans. Pattern Anal. Mach. Intell.
- Appl. Math. Comput.
- PLoS Comput. Biol.
- ICIP
- ICRA
- Comput. Phys. Commun.
- Adv. Appl. Math.
- J. Comput. Phys.
- INTERSPEECH
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Comput. Math. Appl.
- Discret. Math. Theor. Comput. Sci.
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