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Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments.

Aibin YanZhixing LiJie CuiZhengfeng HuangTianming NiPatrick GirardXiaoqing Wen
Published in: IEEE Trans. Aerosp. Electron. Syst. (2023)
Keyphrases
  • highly robust
  • infrared
  • feature selection
  • dynamic environments
  • real world
  • image processing
  • tree structure
  • partial occlusion
  • search space
  • directed graph
  • robotic systems