Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments.
Aibin YanZhixing LiJie CuiZhengfeng HuangTianming NiPatrick GirardXiaoqing WenPublished in: IEEE Trans. Aerosp. Electron. Syst. (2023)