Sign in
Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction.
Hui Xu
Rui Zhu
Xia Sun
Xianjin Fang
Pan Qi
Huaguo Liang
Zhengfeng Huang
Published in:
J. Circuits Syst. Comput. (2023)
Keyphrases
</>
high speed
circuit design
cmos technology
electronic circuits
prediction accuracy
levels of abstraction
prediction algorithm
analog circuits
evolvable hardware
genetic algorithm
power consumption
parallel processing
power dissipation
frequency response
power reduction
analog vlsi