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Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS.
Aibin Yan
Yafei Ling
Kang Yang
Zhili Chen
Maoxiang Yi
Published in:
ATS (2018)
Keyphrases
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error rate
nano scale
estimation error
test set
rule sets
high speed
power consumption
estimation accuracy
word error rate
lower error rates
thermal imaging
lower bound
text entry
cost sensitive classification
low cost
expected loss