Login / Signup
Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design and Layout.
Aibin Yan
Zhen Wu
Jing Guo
Jie Song
Xiaoqing Wen
Published in:
IEEE Trans. Reliab. (2019)
Keyphrases
</>
design process
design principles
computer aided
user interface
knowledge based systems
design tools
neural network
database systems
design requirements