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A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application.

Aibin YanKang YangZhengfeng HuangJiliang ZhangJie CuiXiangsheng FangMaoxiang YiXiaoqing Wen
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2019)
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