Evaluation and Test of Production Defects in Hardened Latches.

Ruijun Ma Stefan Holst Xiaoqing Wen Aibin Yan Hui Xu

Published in: IEICE Trans. Inf. Syst. (2022)

Keyphrases

evaluation methods
comparative evaluation
defect detection
data sets
neural network
machine learning
genetic algorithm
multi agent
information retrieval systems
production planning
production process
semiconductor manufacturing