A Region-Based Through-Silicon via Repair Method for Clustered Faults.
Tianming NiHuaguo LiangMu NieXiumin XuAibin YanZhengfeng HuangPublished in: IEICE Trans. Electron. (2017)
Keyphrases
- high precision
- high accuracy
- preprocessing
- significant improvement
- dynamic programming
- synthetic data
- detection method
- image segmentation
- data sets
- experimental evaluation
- classification accuracy
- support vector machine svm
- fully automatic
- segmentation method
- probabilistic model
- cost function
- multiresolution
- evolutionary algorithm