Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments.
Aibin YanXiangfeng FengYuanjie HuChaoping LaiJie CuiZhili ChenKohei MiyaseXiaoqing WenPublished in: IEEE Trans. Aerosp. Electron. Syst. (2020)