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Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits.
Taiki Utsunomiya
Ryu Hoshino
Kohei Miyase
Shyue-Kung Lu
Xiaoqing Wen
Seiji Kajihara
Published in:
ITC-Asia (2022)
Keyphrases
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logic circuits
tunnel diode
low power
image analysis
probability distribution
pattern matching
power consumption