TUNNEL DIODE
Experts
- Sudhakar M. Reddy
- Robert Wille
- Rolf Drechsler
- Irith Pomeranz
- John P. Hayes
- Marek A. Perkowski
- Kaushik Roy
- Yasuhiro Takahashi
- Igor L. Markov
- Giovanni De Micheli
- Mrinal Kumar
- Srikanth Srinivasan
- Koichi Narahara
- Stasys Jukna
- D. Michael Miller
- Kartik Mohanram
- Shigeru Yamashita
- Massoud Pedram
- Pavel Hrubes
- Srinivas Devadas
- Arturo Hernández Aguirre
- Ramprasad Saptharishi
- Mathias Soeken
- Seiichiro Tani
- Leon O. Chua
- Massimo Alioto
- Carlos A. Coello Coello
- Dmitri Maslov
- Martin Roetteler
- Mohamed Ould-Khaoua
- Paul D. Seymour
- Pavel Pudlák
- Scott C. Smith
- Pinaki Mazumder
- Denis Thérien
- Kozo Kinoshita
- Robert K. Brayton
- James Bartusek
- Chun-Yao Wang
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ISCAS
- IEEE Trans. Computers
- DAC
- Electron. Colloquium Comput. Complex.
- ISMVL
- IACR Cryptol. ePrint Arch.
- IEEE Trans. Very Large Scale Integr. Syst.
- ASP-DAC
- IRE Trans. Electron. Comput.
- IEEE Trans. Circuits Syst. II Express Briefs
- Int. J. Circuit Theory Appl.
- VLSI Design
- DATE
- IEICE Trans. Electron.
- IEEE Access
- IEEE J. Solid State Circuits
- IEEE Trans. Ind. Electron.
- ICECS
- Microelectron. Reliab.
- Microelectron. J.
- Quantum Inf. Process.
- Int. J. Bifurc. Chaos
- J. Electron. Test.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Electron. Comput.
- MWSCAS
- STOC
- ICCD
- ICCAD
- VTS
- J. Circuits Syst. Comput.
- IEEE Trans. Instrum. Meas.
- Computational Complexity Conference
- Asian Test Symposium
- RC
- IEICE Electron. Express
- Discret. Math.
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