TUNNEL DIODE
Experts
- Sudhakar M. Reddy
- Rolf Drechsler
- Robert Wille
- Irith Pomeranz
- John P. Hayes
- Marek A. Perkowski
- Yasuhiro Takahashi
- Igor L. Markov
- Kaushik Roy
- Giovanni De Micheli
- Koichi Narahara
- Stasys Jukna
- Mrinal Kumar
- D. Michael Miller
- Srikanth Srinivasan
- Kartik Mohanram
- Massoud Pedram
- Pavel Hrubes
- Shigeru Yamashita
- Massimo Alioto
- Arturo Hernández Aguirre
- Carlos A. Coello Coello
- Ramprasad Saptharishi
- Srinivas Devadas
- Seiichiro Tani
- Mathias Soeken
- Leon O. Chua
- Paul D. Seymour
- Pinaki Mazumder
- Pavel Pudlák
- Dmitri Maslov
- Mohamed Ould-Khaoua
- Kozo Kinoshita
- Martin Roetteler
- Denis Thérien
- Robert K. Brayton
- Scott C. Smith
- Sachin S. Sapatnekar
- James Bartusek
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ISCAS
- IEEE Trans. Computers
- DAC
- Electron. Colloquium Comput. Complex.
- IACR Cryptol. ePrint Arch.
- ISMVL
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Trans. Very Large Scale Integr. Syst.
- ASP-DAC
- DATE
- IRE Trans. Electron. Comput.
- Int. J. Circuit Theory Appl.
- IEEE Trans. Ind. Electron.
- VLSI Design
- IEEE Access
- IEICE Trans. Electron.
- IEEE J. Solid State Circuits
- Quantum Inf. Process.
- Microelectron. J.
- Int. J. Bifurc. Chaos
- IEEE Trans. Circuits Syst. I Regul. Pap.
- Microelectron. Reliab.
- ICECS
- J. Electron. Test.
- STOC
- IEEE Trans. Electron. Comput.
- MWSCAS
- ICCD
- ICCAD
- VTS
- J. Circuits Syst. Comput.
- IEEE Trans. Instrum. Meas.
- IEICE Electron. Express
- Computational Complexity Conference
- Asian Test Symposium
- RC
- ITC
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