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Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling.
Shiling Shi
Stefan Holst
Xiaoqing Wen
Published in:
MCSoC (2023)
Keyphrases
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information retrieval
test data
information retrieval systems
text retrieval
data sets
neural network
case study
image sequences
query expansion
test cases
risk management
test suite