Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling.

Shiling Shi Stefan Holst Xiaoqing Wen

Published in: MCSoC (2023)

Keyphrases

information retrieval
test data
information retrieval systems
text retrieval
data sets
neural network
case study
image sequences
query expansion
test cases
risk management
test suite