TEST SUITE
Experts
- Tsong Yueh Chen
- Gordon Fraser
- Irith Pomeranz
- Gregg Rothermel
- Lionel C. Briand
- Andrea Arcuri
- Yves Le Traon
- Sudhakar M. Reddy
- Franz Wotawa
- Antonia Bertolino
- Mark Harman
- Mike Papadakis
- Atif M. Memon
- José Carlos Maldonado
- Rudolf Ramler
- Matteo Sonza Reorda
- Mary Jean Harrold
- T. H. Tse
- Lu Zhang
- Vahid Garousi
- Ina Schieferdecker
- Lingming Zhang
- Dan Hao
- Robert M. Hierons
- Tao Xie
- Michael Felderer
- Krishnendu Chakrabarty
- Zhenyu Chen
- Darko Marinov
- Hyunsook Do
- Annibale Panichella
- Andy Zaidman
- Baowen Xu
- W. Eric Wong
- W. K. Chan
- Paolo Tonella
- Bernhard K. Aichernig
- Arnaud Gotlieb
- Jinfu Chen
Venues
- CoRR
- ICST
- ITC
- ICST Workshops
- IEEE Trans. Software Eng.
- Inf. Softw. Technol.
- Softw. Test. Verification Reliab.
- ICSE
- ASE
- J. Syst. Softw.
- ISSTA
- ISSRE
- ACM SIGSOFT Softw. Eng. Notes
- COMPSAC
- SEKE
- ICSM
- ESEC/SIGSOFT FSE
- Softw. Qual. J.
- APSEC
- QSIC
- VTS
- IEEE Access
- SAC
- SPLC
- Empir. Softw. Eng.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Asian Test Symposium
- Electron. Notes Theor. Comput. Sci.
- AST
- QRS Companion
- ACM Trans. Softw. Eng. Methodol.
- IEEE Softw.
- SAS
- Sci. Comput. Program.
- DATE
- J. Electron. Test.
- Int. J. Softw. Tools Technol. Transf.
- ICTSS
- ICSME
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