Michael A. Kochte

ORCID

Publication Activity (10 Years)

Years Active: 2008-2020
Publications (10 Years): 22

Top Venues

University of Stuttgart (PHD)

Education History

University of Stuttgart

PHD

Publications

Sebastian Brandhofer, Michael A. Kochte, Hans-Joachim Wunderlich
Synthesis of Fault-Tolerant Reconfigurable Scan Networks. DATE (2020)
Matthias Kampmann, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, Hans-Joachim Wunderlich
Built-In Test for Hidden Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (10) (2019)
Stefan Holst, Eric Schneider, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich
Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses. ITC (2019)
Michael A. Kochte, Hans-Joachim Wunderlich
Self-Test and Diagnosis for Self-Aware Systems. IEEE Des. Test 35 (5) (2018)
Pascal Raiola, Michael A. Kochte, Ahmed Atteya, Laura Rodríguez Gómez, Hans-Joachim Wunderlich, Bernd Becker, Matthias Sauer
Detecting and Resolving Security Violations in Reconfigurable Scan Networks. IOLTS (2018)
Eric Schneider, Michael A. Kochte, Hans-Joachim Wunderlich
Multi-level timing simulation on GPUs. ASP-DAC (2018)
Ahmed Atteya, Michael A. Kochte, Matthias Sauer, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich
Online prevention of security violations in reconfigurable scan networks. ETS (2018)
Eric Schneider, Michael A. Kochte, Stefan Holst, Xiaoqing Wen, Hans-Joachim Wunderlich
GPU-Accelerated Simulation of Small Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (5) (2017)
Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich
Aging monitor reuse for small delay fault testing. VTS (2017)
Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen
Analysis and mitigation or IR-Drop induced scan shift-errors. ITC (2017)
Dominik Ull, Michael A. Kochte, Hans-Joachim Wunderlich
Structure-Oriented Test of Reconfigurable Scan Networks. ATS (2017)
Michael A. Kochte, Rafal Baranowski, Hans-Joachim Wunderlich
Trustworthy reconfigurable access to on-chip infrastructure. ITC-Asia (2017)
Michael A. Kochte, Matthias Sauer, Laura Rodríguez Gómez, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich
Specification and verification of security in reconfigurable scan networks. ETS (2017)
Hongyan Zhang, Lars Bauer, Michael A. Kochte, Eric Schneider, Hans-Joachim Wunderlich, Jörg Henkel
Aging Resilience and Fault Tolerance in Runtime Reconfigurable Architectures. IEEE Trans. Computers 66 (6) (2017)
Stefan Holst, Eric Schneider, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Hans-Joachim Wunderlich, Michael A. Kochte
Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths During At-Speed Scan Test. ATS (2016)
Michael A. Kochte, Rafal Baranowski, Marcel Schaal, Hans-Joachim Wunderlich
Test Strategies for Reconfigurable Scan Networks. ATS (2016)
Alexander Schöll, Claus Braun, Michael A. Kochte, Hans-Joachim Wunderlich
Efficient Algorithm-Based Fault Tolerance for Sparse Matrix Operations. DSN (2016)
Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns. ASP-DAC (2016)
Kuen-Jong Lee, Pin-Hao Tang, Michael A. Kochte
An on-chip self-test architecture with test patterns recorded in scan chains. ITC (2016)
Michael A. Kochte, Rafal Baranowski, Matthias Sauer, Bernd Becker, Hans-Joachim Wunderlich
Formal verification of secure reconfigurable scan network infrastructure. ETS (2016)
Jin-Cun Ye, Michael A. Kochte, Kuen-Jong Lee, Hans-Joachim Wunderlich
Autonomous Testing for 3D-ICs with IEEE Std. 1687. ATS (2016)
Michael A. Kochte, Hans-Joachim Wunderlich
Dependable on-chip infrastructure for dependable MPSOCs. LATS (2016)
K. Asada, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Michael A. Kochte, Eric Schneider, Hans-Joachim Wunderlich, J. Qian
Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch. ATS (2015)
Matthias Kampmann, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, Hans-Joachim Wunderlich
Optimized Selection of Frequencies for Faster-Than-at-Speed Test. ATS (2015)
Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich
Fine-Grained Access Management in Reconfigurable Scan Networks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (6) (2015)
Lars Bauer, Jörg Henkel, Andreas Herkersdorf, Michael A. Kochte, Johannes Maximilian Kühn, Wolfgang Rosenstiel, Thomas Schweizer, Stefan Wallentowitz, Volker Wenzel, Thomas Wild, Hans-Joachim Wunderlich, Hongyan Zhang
Adaptive multi-layer techniques for increased system dependability. it Inf. Technol. 57 (3) (2015)
Michael A. Kochte, Atefe Dalirsani, Andrea Bernabei, Martin Omaña, Cecilia Metra, Hans-Joachim Wunderlich
Intermittent and Transient Fault Diagnosis on Sparse Code Signatures. ATS (2015)
Eric Schneider, Stefan Holst, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich
GPU-accelerated small delay fault simulation. DATE (2015)
Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich
Efficient observation point selection for aging monitoring. IOLTS (2015)
Alexander Schöll, Claus Braun, Michael A. Kochte, Hans-Joachim Wunderlich
Efficient on-line fault-tolerance for the preconditioned conjugate gradient method. IOLTS (2015)
Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich
Reconfigurable Scan Networks: Modeling, Verification, and Optimal Pattern Generation. ACM Trans. Design Autom. Electr. Syst. 20 (2) (2015)
Alexander Schöll, Claus Braun, Michael A. Kochte, Hans-Joachim Wunderlich
Low-overhead fault-tolerance for the preconditioned conjugate gradient solver. DFTS (2015)
Dominik Erb, Michael A. Kochte, Sven Reimer, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (12) (2015)
Hongyan Zhang, Michael A. Kochte, Eric Schneider, Lars Bauer, Hans-Joachim Wunderlich, Jörg Henkel
STRAP: Stress-Aware Placement for Aging Mitigation in Runtime Reconfigurable Architectures. ICCAD (2015)
Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich
Area-efficient synthesis of fault-secure NoC switches. IOLTS (2014)
Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich
Verifikation Rekonfigurierbarer Scan-Netze. MBMV (2014)
Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich
Access Port Protection for Reconfigurable Scan Networks. J. Electron. Test. 30 (6) (2014)
Dominik Erb, Michael A. Kochte, Matthias Sauer, Stefan Hillebrecht, Tobias Schubert, Hans-Joachim Wunderlich, Bernd Becker
Exact Logic and Fault Simulation in Presence of Unknowns. ACM Trans. Design Autom. Electr. Syst. 19 (3) (2014)
Hongyan Zhang, Michael A. Kochte, Michael E. Imhof, Lars Bauer, Hans-Joachim Wunderlich, Jörg Henkel
GUARD: GUAranteed Reliability in Dynamically Reconfigurable Systems. DAC (2014)
Andreas Herkersdorf, Hananeh Aliee, Michael Engel, Michael Glaß, Christina Gimmler-Dumont, Jörg Henkel, Veit Kleeberger, Michael A. Kochte, Johannes Maximilian Kühn, Daniel Mueller-Gritschneder, Sani R. Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich
Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience. Microelectron. Reliab. 54 (6-7) (2014)
Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich
FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. ITC (2014)
Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
Test pattern generation in presence of unknown values based on restricted symbolic logic. ITC (2014)
Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Eric Schneider, Hongyan Zhang, Jörg Henkel, Hans-Joachim Wunderlich
Test Strategies for Reliable Runtime Reconfigurable Architectures. IEEE Trans. Computers 62 (8) (2013)
Hongyan Zhang, Lars Bauer, Michael A. Kochte, Eric Schneider, Claus Braun, Michael E. Imhof, Hans-Joachim Wunderlich, Jörg Henkel
Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures. ITC (2013)
Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich
SAT-based code synthesis for fault-secure circuits. DFTS (2013)
Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker
Accurate QBF-based test pattern generation in presence of unknown values. DATE (2013)
Yuta Yamato, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, Michael A. Kochte
LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing. IEEE Des. Test 30 (4) (2013)
Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich
Scan pattern retargeting and merging with reduced access time. ETS (2013)
Dominik Erb, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
Accurate Multi-cycle ATPG in Presence of X-Values. Asian Test Symposium (2013)
Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich
Securing Access to Reconfigurable Scan Networks. Asian Test Symposium (2013)
Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang, Hans-Joachim Wunderlich, Jörg Henkel
OTERA: Online test strategies for reliable reconfigurable architectures - Invited paper for the AHS-2012 special session "Dependability by reconfigurable hardware". AHS (2012)
Stefan Hillebrecht, Michael A. Kochte, Hans-Joachim Wunderlich, Bernd Becker
Exact stuck-at fault classification in presence of unknowns. ETS (2012)
Mohamed Abdelfattah, Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang, Jörg Henkel, Hans-Joachim Wunderlich
Transparent structural online test for reconfigurable systems. IOLTS (2012)
Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich
Modeling, verification and pattern generation for reconfigurable scan networks. ITC (2012)
Michael A. Kochte, Melanie Elm, Hans-Joachim Wunderlich
Accurate X-Propagation for Test Applications by SAT-Based Reasoning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (12) (2012)
Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich
SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. ISLPED (2011)
Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang
A novel scan segmentation design method for avoiding shift timing failure in scan testing. ITC (2011)
Michael A. Kochte, Hans-Joachim Wunderlich
SAT-based fault coverage evaluation in the presence of unknown values. DATE (2011)
Rafal Baranowski, Stefano Di Carlo, Nadereh Hatami, Michael E. Imhof, Michael A. Kochte, Paolo Prinetto, Hans-Joachim Wunderlich, Christian G. Zoellin
Efficient multi-level fault simulation of HW/SW systems for structural faults. Sci. China Inf. Sci. 54 (9) (2011)
Michael A. Kochte, Sandip Kundu, Kohei Miyase, Xiaoqing Wen, Hans-Joachim Wunderlich
Efficient BDD-based Fault Simulation in Presence of Unknown Values. Asian Test Symposium (2011)
Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor
Power-aware test generation with guaranteed launch safety for at-speed scan testing. VTS (2011)
Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto
Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level. Asian Test Symposium (2010)
Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto
System reliability evaluation using concurrent multi-level simulation of structural faults. ITC (2010)
Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich
Efficient Concurrent Self-Test with Partially Specified Patterns. J. Electron. Test. 26 (5) (2010)
Melanie Elm, Michael A. Kochte, Hans-Joachim Wunderlich
On Determining the Real Output Xs by SAT-Based Reasoning. Asian Test Symposium (2010)
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wunderlich, Christian G. Zoellin
Efficient fault simulation on many-core processors. DAC (2010)
Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich
Test Encoding for Extreme Response Compaction. ETS (2009)
Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Rauf Salimi Khaligh, Martin Radetzki, Hans-Joachim Wunderlich, Stefano Di Carlo, Paolo Prinetto
Test exploration and validation using transaction level models. DATE (2009)
Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead. ETS (2009)
Michael A. Kochte, Ramesh Natarajan
A framework for scheduling parallel dbms user-defined programs on an attached high-performance computer. Conf. Computing Frontiers (2008)
Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Hans-Joachim Wunderlich
Test Set Stripping Limiting the Maximum Number of Specified Bits. DELTA (2008)

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Publication Activity (10 Years)

Top Topics

Top Venues

Michael A. Kochte