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Built-In Test for Hidden Delay Faults.

Matthias KampmannMichael A. KochteChang LiuEric SchneiderSybille HellebrandHans-Joachim Wunderlich
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2019)
Keyphrases
  • test cases
  • neural network
  • real world
  • fault diagnosis
  • model based diagnosis
  • database
  • real time
  • computer vision
  • information systems
  • end to end
  • fault detection
  • hidden information
  • mutation testing