FAULT DETECTION
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Steven X. Ding
- Bin Jiang
- Khashayar Khorasani
- Guang-Hong Yang
- Krishnendu Chakrabarty
- Jong-Myon Kim
- Donghua Zhou
- Marios M. Polycarpou
- Vishwani D. Agrawal
- Mehrdad Saif
- Nader Meskin
- Xuefeng Chen
- Kewal K. Saluja
- Matteo Sonza Reorda
- Vicenç Puig
- Fengshou Gu
- Thomas Parisini
- Mohamed N. Nounou
- Shen Yin
- Andrew D. Ball
- Hazem N. Nounou
- Hiroshi Takahashi
- Majdi Mansouri
- Peng Shi
- Rui Abreu
- Maiying Zhong
- Bernd Becker
- Haidong Shao
- Fabrizio Lombardi
- Ruqiang Yan
- Zhongkui Zhu
- Janusz Rajski
- Raimund Ubar
- Abhijit Chatterjee
- Xiao He
- Ilia Polian
- Chuan Li
Venues
- IEEE Access
- CoRR
- Sensors
- IEEE Trans. Ind. Electron.
- IEEE Trans. Instrum. Meas.
- IECON
- ACC
- ITC
- IEEE Trans. Ind. Informatics
- IEEE Trans. Computers
- Expert Syst. Appl.
- CDC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ECC
- VTS
- Neurocomputing
- Entropy
- Eng. Appl. Artif. Intell.
- Reliab. Eng. Syst. Saf.
- Autom.
- J. Electron. Test.
- IAS
- Asian Test Symposium
- DATE
- J. Frankl. Inst.
- Appl. Soft Comput.
- IEEE Trans. Control. Syst. Technol.
- SMC
- DFT
- Int. J. Syst. Sci.
- IACR Cryptol. ePrint Arch.
- Comput. Chem. Eng.
- CAA SAFEPROCESS
- DAC
- ETFA
- ICPHM
- J. Intell. Fuzzy Syst.
- ISIE
- IEEE Trans. Veh. Technol.
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