MUTATION TESTING
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Gordon Fraser
- Mike Papadakis
- Vishwani D. Agrawal
- Andrea Arcuri
- Nina Yevtushenko
- Robert M. Hierons
- Mark Harman
- Yves Le Traon
- Hideo Fujiwara
- José Carlos Maldonado
- Inmaculada Medina-Bulo
- Tao Xie
- Kewal K. Saluja
- Bernhard K. Aichernig
- Jacob A. Abraham
- Khaled El-Fakih
- Prabhat Mishra
- Melvin A. Breuer
- Janak H. Patel
- Gregory Gay
- Yoshinobu Higami
- Raimund Ubar
- Seiji Kajihara
- Alexandre Petrenko
- Yuzo Takamatsu
- Serge Demeyer
- Gregg Rothermel
- Darko Marinov
- Xiaoqing Wen
- Lingming Zhang
- Andy Zaidman
- Pedro Delgado-Pérez
- W. Eric Wong
- Kozo Kinoshita
- Jaan Raik
- Yue Jia
- Sandeep K. Gupta
Venues
- CoRR
- ITC
- ICST
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICST Workshops
- VTS
- Inf. Softw. Technol.
- Softw. Test. Verification Reliab.
- ICSE
- DAC
- ISSTA
- IEEE Trans. Software Eng.
- ICCAD
- ASE
- Asian Test Symposium
- IEEE Trans. Computers
- DATE
- J. Electron. Test.
- J. Syst. Softw.
- VLSI Design
- ISSRE
- IEEE Trans. Very Large Scale Integr. Syst.
- ACM Trans. Design Autom. Electr. Syst.
- ESEC/SIGSOFT FSE
- SSBSE
- ICTSS
- ACM Trans. Softw. Eng. Methodol.
- SAC
- FORTE
- Empir. Softw. Eng.
- HLDVT
- AST@ICSE
- ICCD
- ETS
- ATS
- QSIC
- Softw. Qual. J.
- ICSE Companion
- GECCO
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