MUTATION TESTING
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Gordon Fraser
- Mike Papadakis
- Vishwani D. Agrawal
- Nina Yevtushenko
- Andrea Arcuri
- Robert M. Hierons
- Mark Harman
- Yves Le Traon
- Hideo Fujiwara
- José Carlos Maldonado
- Bernhard K. Aichernig
- Kewal K. Saluja
- Tao Xie
- Inmaculada Medina-Bulo
- Jacob A. Abraham
- Khaled El-Fakih
- Prabhat Mishra
- Janak H. Patel
- Melvin A. Breuer
- Gregory Gay
- Seiji Kajihara
- Serge Demeyer
- Yuzo Takamatsu
- Yoshinobu Higami
- Raimund Ubar
- Alexandre Petrenko
- Gregg Rothermel
- Lingming Zhang
- Darko Marinov
- Xiaoqing Wen
- Matteo Sonza Reorda
- W. Eric Wong
- Jaan Raik
- Márcio Eduardo Delamaro
- Andy Zaidman
- Hiroshi Takahashi
- Yue Jia
Venues
- CoRR
- ITC
- ICST
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICST Workshops
- VTS
- Inf. Softw. Technol.
- Softw. Test. Verification Reliab.
- ICSE
- DAC
- ISSTA
- IEEE Trans. Software Eng.
- ASE
- ICCAD
- Asian Test Symposium
- IEEE Trans. Computers
- DATE
- J. Syst. Softw.
- J. Electron. Test.
- VLSI Design
- ISSRE
- IEEE Trans. Very Large Scale Integr. Syst.
- ACM Trans. Design Autom. Electr. Syst.
- ESEC/SIGSOFT FSE
- SSBSE
- ICTSS
- ACM Trans. Softw. Eng. Methodol.
- FORTE
- SAC
- AST@ICSE
- QSIC
- Empir. Softw. Eng.
- ETS
- ATS
- ICCD
- HLDVT
- Softw. Qual. J.
- GECCO
- ICSE Companion
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