FAULT DIAGNOSIS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Steven X. Ding
- Bin Jiang
- Krishnendu Chakrabarty
- Khashayar Khorasani
- Guang-Hong Yang
- Jinde Cao
- Jong-Myon Kim
- Mehrdad Saif
- Abhijit Chatterjee
- Marios M. Polycarpou
- Matteo Sonza Reorda
- Donghua Zhou
- Vishwani D. Agrawal
- Nader Meskin
- Peng Shi
- Sun-Yuan Hsieh
- Xuefeng Chen
- Shen Yin
- Ruqiang Yan
- Fabrizio Lombardi
- Kewal K. Saluja
- Yang Liu
- Janusz Rajski
- Kwang-Ting Cheng
- Fengshou Gu
- Wu-Tung Cheng
- Hiroshi Takahashi
- Andrew D. Ball
- Patrick Girard
- Thomas Parisini
- Hazem N. Nounou
- Vicenç Puig
- Raimund Ubar
- Mohamed N. Nounou
- Majdi Mansouri
- Cheng-Wen Wu
- Haidong Shao
Venues
- CoRR
- IEEE Access
- Sensors
- IEEE Trans. Ind. Electron.
- IEEE Trans. Instrum. Meas.
- IECON
- ACC
- Neurocomputing
- Expert Syst. Appl.
- IJCNN
- ITC
- IEEE Trans. Ind. Informatics
- CDC
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- Neural Comput. Appl.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Neural Networks
- Appl. Soft Comput.
- IAS
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- SMC
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- DATE
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- Autom.
- J. Intell. Fuzzy Syst.
- ISCAS
- DAC
- J. Electron. Test.
- ICASSP
- IEEE Trans. Control. Syst. Technol.
- Remote. Sens.
- Inf. Sci.
- Asian Test Symposium
- IEEE Trans. Smart Grid
- AAAI
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