Sani R. Nassif

Publication Activity (10 Years)

Years Active: 1984-2024
Publications (10 Years): 11

Top Venues

ISQED

DATE

IEEE Trans. Very Large Scale Integr. Syst.

ISPD

Publications

Priyanjana Pal, Haibin Zhao, Maha Shatta, Michael Hefenbrock, Sina Bakhtavari Mamaghani, Sani R. Nassif, Michael Beigl, Mehdi B. Tahoori
Analog Printed Spiking Neuromorphic Circuit. DATE (2024)
Philipp Fengler, Sani R. Nassif, Ulf Schlichtmann
Toward Early Stage Dynamic Power Estimation: Exploring Alternative Machine Learning Methods and Simulation Schemes. ISQED (2024)
Jan Lappas, Mohamed Amine Riahi, Christian Weis, Norbert Wehn, Sani R. Nassif
Timing Analysis beyond Complementary CMOS Logic Styles. ASPDAC (2024)
Zhe Zhang, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif
Do Radiation and Aging Impact DVFS? TCAD-based Analysis on 22 nm FDSOI Latches. IOLTS (2024)
Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. VTS (2024)
Grégoire Eggermann, Marco Rios, Giovanni Ansaloni, Sani R. Nassif, David Atienza
A 16-bit Floating-Point Near-SRAM Architecture for Low-power Sparse Matrix-Vector Multiplication. VLSI-SoC (2023)
Alexandra Listl, Daniel Mueller-Gritschneder, Ulf Schlichtmann, Sani R. Nassif
SRAM Design Exploration with Integrated Application-Aware Aging Analysis. DATE (2019)
Di-An Li, Malgorzata Marek-Sadowska, Sani R. Nassif
A Method for Improving Power Grid Resilience to Electromigration-Caused via Failures. IEEE Trans. Very Large Scale Integr. Syst. 23 (1) (2015)
Di-An Li, Malgorzata Marek-Sadowska, Sani R. Nassif
T-VEMA: A Temperature- and Variation-Aware Electromigration Power Grid Analysis Tool. IEEE Trans. Very Large Scale Integr. Syst. 23 (10) (2015)
Mohammad Saber Golanbari, Saman Kiamehr, Mehdi Baradaran Tahoori, Sani R. Nassif
Analysis and optimization of flip-flops under process and runtime variations. ISQED (2015)
Sani R. Nassif, Martin A. Trefzer
Editorial. IET Comput. Digit. Tech. 9 (4) (2015)
Zhong Guan, Malgorzata Marek-Sadowska, Sani R. Nassif
Statistical analysis of process variation induced SRAM electromigration degradation. ISQED (2014)
Gi-Joon Nam, Sani R. Nassif
Opportunities in power distribution network system optimization: from EDA perspective. ISPD (2014)
Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn
Connecting different worlds - Technology abstraction for reliability-aware design and Test. DATE (2014)
Saman Kiamehr, Thomas H. Osiecki, Mehdi Baradaran Tahoori, Sani R. Nassif
Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach. DAC (2014)
Iris Hui-Ru Jiang, Gi-Joon Nam, Hua-Yu Chang, Sani R. Nassif, Jerry Hayes
Smart grid load balancing techniques via simultaneous switch/tie-line/wire configurations. ICCAD (2014)
Andreas Herkersdorf, Hananeh Aliee, Michael Engel, Michael Glaß, Christina Gimmler-Dumont, Jörg Henkel, Veit Kleeberger, Michael A. Kochte, Johannes Maximilian Kühn, Daniel Mueller-Gritschneder, Sani R. Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich
Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience. Microelectron. Reliab. 54 (6-7) (2014)
Sani R. Nassif, Gi-Joon Nam, Jerry Hayes, Sani Fakhouri
Applying VLSI EDA to energy distribution system design. ASP-DAC (2014)
Shayak Banerjee, Zhuo Li, Sani R. Nassif
ICCAD-2013 CAD contest in mask optimization and benchmark suite. ICCAD (2013)
Jörg Henkel, Lars Bauer, Nikil D. Dutt, Puneet Gupta, Sani R. Nassif, Muhammad Shafique, Mehdi Baradaran Tahoori, Norbert Wehn
Reliable on-chip systems in the nano-era: lessons learnt and future trends. DAC (2013)
Thomas H. Osiecki, Min-Yu Tsai, Anne E. Gattiker, Damir A. Jamsek, Sani R. Nassif, William Evan Speight, Cliff C. N. Sze
Hardware Acceleration of an Efficient and Accurate Proton Therapy Monte Carlo. ICCS (2013)
Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori, Sani R. Nassif
Incorporating the impacts of workload-dependent runtime variations into timing analysis. DATE (2013)
Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars Liebmann, Puneet Gupta
Layout Decomposition and Legalization for Double-Patterning Technology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (2) (2013)
Zhong Guan, Malgorzata Marek-Sadowska, Sani R. Nassif
SRAM bit-line electromigration mechanism and its prevention scheme. ISQED (2013)
Yuma Higuchi, Kenichi Shinkai, Masanori Hashimoto, Rahul M. Rao, Sani R. Nassif
Extracting device-parameter variations using a single sensitivity-configurable ring oscillator. ETS (2013)
Sani R. Nassif, Gi-Joon Nam, Shayak Banerjee
Wire delay variability in nanoscale technology and its impact on physical design. ISQED (2013)
Veit Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller-Gritschneder, Sani R. Nassif, Ulf Schlichtmann, Norbert Wehn
A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience. IEEE Micro 33 (4) (2013)
Sani R. Nassif, Yale N. Patt, Magdy S. Abadir
Keynote 1 - VLSI 2.0: R&D Post Moore. VLSI-SoC (2013)
Binjie Cheng, Xingsheng Wang, Andrew R. Brown, Jente B. Kuang, Dave Reid, Campbell Millar, Sani R. Nassif, Asen Asenov
SRAM device and cell co-design considerations in a 14nm SOI FinFET technology. ISCAS (2013)
Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Jente B. Kuang, Sani R. Nassif, Asen Asenov
Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability. ESSDERC (2013)
Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham
An oscillation-based test structure for timing information extraction. VTS (2012)
Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jerry Hayes, Sani R. Nassif
Yield estimation via multi-cones. DAC (2012)
Anand Ramalingam, Ashish Kumar Singh, Sani R. Nassif, Gi-Joon Nam, Michael Orshansky, David Z. Pan
An accurate sparse-matrix based framework for statistical static timing analysis. Integr. 45 (4) (2012)
Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars W. Liebmann, Puneet Gupta
O(n) layout-coloring for multiple-patterning lithography and conflict-removal using compaction. ICICDT (2012)
Shayak Banerjee, Kanak B. Agarwal, Sani R. Nassif
Design-aware lithography. ISPD (2012)
Zhuo Li, Raju Balasubramanian, Frank Liu, Sani R. Nassif
2012 TAU power grid simulation contest: Benchmark suite and results. ICCAD (2012)
Vijay Janapa Reddi, David Z. Pan, Sani R. Nassif, Keith A. Bowman
Robust and resilient designs from the bottom-up: Technology, CAD, circuit, and system issues. ASP-DAC (2012)
Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham
Efficient and product-representative timing model validation. VTS (2011)
Jente B. Kuang, Jeremy D. Schaub, Fadi H. Gebara, Dieter F. Wendel, Thomas Fröhnel, Sudesh Saroop, Sani R. Nassif, Kevin J. Nowka
The Design and Characterization of a Half-Volt 32 nm Dual-Read 6T SRAM. IEEE Trans. Circuits Syst. I Regul. Pap. (9) (2011)
Shayak Banerjee, Kanak B. Agarwal, Sani R. Nassif
Electrically-driven retargeting for nanoscale layouts. CICC (2011)
Shayak Banerjee, Kanak B. Agarwal, Sani R. Nassif, James A. Culp, Lars Liebmann, Michael Orshansky
Coupling timing objectives with optical proximity correction for improved timing yield. ISQED (2011)
Zhuo Li, Raju Balasubramanian, Frank Liu, Sani R. Nassif
2011 TAU power grid simulation contest: Benchmark suite and results. ICCAD (2011)
Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif
Simultaneous Layout Migration and Decomposition for Double Patterning Technology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (2) (2011)
Yun Ye, Frank Liu, Min Chen, Sani R. Nassif, Yu Cao
Statistical Modeling and Simulation of Threshold Variation Under Random Dopant Fluctuations and Line-Edge Roughness. IEEE Trans. Very Large Scale Integr. Syst. 19 (6) (2011)
Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars Liebmann, Puneet Gupta
A framework for double patterning-enabled design. ICCAD (2011)
Xiaoji Ye, Wei Dong, Peng Li, Sani R. Nassif
Hierarchical Multialgorithm Parallel Circuit Simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (1) (2011)
Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham
Post-Silicon Timing Validation Method Using Path Delay Measurements. Asian Test Symposium (2011)
Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif
The Impact of Statistical Leakage Models on Design Yield Estimation. VLSI Design 2011 (2011)
Mehrdad Majzoobi, Golsa Ghiaasi, Farinaz Koushanfar, Sani R. Nassif
Ultra-low power current-based PUF. ISCAS (2011)
Rouwaida Kanj, Tong Li, Rajiv V. Joshi, Kanak Agarwal, Ali Sadigh, David Winston, Sani R. Nassif
Accelerated statistical simulation via on-demand Hermite spline interpolations. ICCAD (2011)
Ritu Singhal, Asha Balijepalli, Anupama R. Subramaniam, Chi-Chao Wang, Frank Liu, Sani R. Nassif, Yu Cao
Modeling and Analysis of the Nonrectangular Gate Effect for Postlithography Circuit Simulation. IEEE Trans. Very Large Scale Integr. Syst. 18 (4) (2010)
Sani R. Nassif, Nikil Mehta, Yu Cao
A resilience roadmap. DATE (2010)
Sani R. Nassif
'Tis the gift to be simple. IEEE Des. Test Comput. 27 (2) (2010)
Jente B. Kuang, Jeremy D. Schaub, Fadi H. Gebara, Dieter F. Wendel, Sudesh Saroop, Tuyet Nguyen, Thomas Fröhnel, Antje Müller, Christopher M. Durham, Rolf Sautter, Bryan Lloyd, Bryan J. Robbins, Juergen Pille, Sani R. Nassif, Kevin J. Nowka
A 32nm 0.5V-supply dual-read 6T SRAM. CICC (2010)
Sani R. Nassif, Kevin J. Nowka
Physical design challenges beyond the 22nm node. ISPD (2010)
Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif
Statistical leakage modeling for accurate yield analysis: the CDF matching method and its alternatives. ISLPED (2010)
Shayak Banerjee, Kanak B. Agarwal, Chin Ngai Sze, Sani R. Nassif, Michael Orshansky
A methodology for propagating design tolerances to shape tolerances for use in manufacturing. DATE (2010)
Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif
Template-mask design methodology for double patterning technology. ICCAD (2010)
Sani R. Nassif
The light at the end of the CMOS tunnel. ASAP (2010)
Nancy Ying Zhou, Rouwaida Kanj, Kanak Agarwal, Zhuo Li, Rajiv V. Joshi, Sani R. Nassif, Weiping Shi
The impact of BEOL lithography effects on the SRAM cell performance and yield. ISQED (2009)
Rouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, William R. Reohr, Sani R. Nassif, Kevin J. Nowka
Statistical yield analysis of silicon-on-insulator embedded DRAM. ISQED (2009)
Aditya Bansal, Rama N. Singh, Rouwaida Kanj, Saibal Mukhopadhyay, Jin-Fuw Lee, Emrah Acar, Amith Singhee, Keunwoo Kim, Ching-Te Chuang, Sani R. Nassif, Fook-Luen Heng, Koushik K. Das
Yield estimation of SRAM circuits using "Virtual SRAM Fab". ICCAD (2009)
Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif
Simultaneous layout migration and decomposition for double patterning technology. ICCAD (2009)
Rouwaida Kanj, Rajiv V. Joshi, Chad Adams, James D. Warnock, Sani R. Nassif
An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects. ICCAD (2009)
Sherief Reda, Sani R. Nassif
Analyzing the impact of process variations on parametric measurements: Novel models and applications. DATE (2009)
Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jente B. Kuang, Hung C. Ngo, Nancy Ying Zhou, Weiping Shi, Sani R. Nassif
SRAM methodology for yield and power efficiency: per-element selectable supplies and memory reconfiguration schemes. ISLPED (2008)
Victoria Wang, Kanak Agarwal, Sani R. Nassif, Kevin J. Nowka, Dejan Markovic
A Design Model for Random Process Variability. ISQED (2008)
Rouwaida Kanj, Zhuo Li, Rajiv V. Joshi, Frank Liu, Sani R. Nassif
A Root-Finding Method for Assessing SRAM Stability. ISQED (2008)
Sani R. Nassif
Technology modeling and characterization beyond the 45nm node. ASP-DAC (2008)
Kevin J. Nowka, Sani R. Nassif, Kanak Agarwal
Characterization and design for variability and reliability. CICC (2008)
Sani R. Nassif
Power grid analysis benchmarks. ASP-DAC (2008)
Rouwaida Kanj, Rajiv V. Joshi, Keunwoo Kim, Richard Williams, Sani R. Nassif
Statistical Evaluation of Split Gate Opportunities for Improved 8T/6T Column-Decoupled SRAM Cell Yield. ISQED (2008)
Kanak Agarwal, Sani R. Nassif
The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. IEEE Trans. Very Large Scale Integr. Syst. 16 (1) (2008)
Fadi J. Kurdahi, Nikil D. Dutt, Ahmed M. Eltawil, Sani R. Nassif
Cross-Layer Approaches to Designing Reliable Systems Using Unreliable Chips. VLSI Design (2008)
Rajeshwary Tayade, Sani R. Nassif, Jacob A. Abraham
Analytical model for the impact of multiple input switching noise on timing. ASP-DAC (2008)
Sani R. Nassif
Process variability at the 65nm node and beyond. CICC (2008)
Diana Marculescu, Sani R. Nassif
Design Variability: Challenges and Solutions at Microarchitecture-Architecture Level. DATE (2008)
Xiaoji Ye, Wei Dong, Peng Li, Sani R. Nassif
MAPS: multi-algorithm parallel circuit simulation. ICCAD (2008)
Sani R. Nassif
Model to Hardware Matching for nm Scale Technologies. PATMOS (2008)
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness. DAC (2008)
Rajeshwary Tayade, Vijay Kiran Kalyanam, Sani R. Nassif, Michael Orshansky, Jacob A. Abraham
Estimating path delay distribution considering coupling noise. ACM Great Lakes Symposium on VLSI (2007)
Kanak Agarwal, Sani R. Nassif
Characterizing Process Variation in Nanometer CMOS. DAC (2007)
Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, Sani R. Nassif
Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction CoRR (2007)
Sani R. Nassif
Model to Hardware matching for nano-meter scale technologies. ESSCIRC (2007)
Rouwaida Kanj, Rajiv V. Joshi, Jayakumaran Sivagnaname, Jente B. Kuang, Dhruva Acharyya, Tuyet Nguyen, Chandler McDowell, Sani R. Nassif
Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. ISQED (2007)
Anand Ramalingam, Ashish Kumar Singh, Sani R. Nassif, Michael Orshansky, David Z. Pan
Accurate Waveform Modeling using Singular Value Decomposition with Applications to Timing Analysis. DAC (2007)
Ritu Singhal, Asha Balijepalli, Anupama R. Subramaniam, Frank Liu, Sani R. Nassif, Yu Cao
Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation. DAC (2007)
Wei Zhao, Yu Cao, Frank Liu, Kanak Agarwal, Dhruva Acharyya, Sani R. Nassif, Kevin J. Nowka
Rigorous extraction of process variations for 65nm CMOS design. ESSCIRC (2007)
Praveen Elakkumanan, Jente B. Kuang, Kevin J. Nowka, Ramalingam Sridhar, Rouwaida Kanj, Sani R. Nassif
SRAM Local Bit Line Access Failure Analyses. ISQED (2006)
Fadi J. Kurdahi, Ahmed M. Eltawil, Young-Hwan Park, Rouwaida Kanj, Sani R. Nassif
System-Level SRAM Yield Enhancement. ISQED (2006)
Kanak Agarwal, Sani R. Nassif
Statistical analysis of SRAM cell stability. DAC (2006)
Anand Ramalingam, David Z. Pan, Frank Liu, Sani R. Nassif
Accurate Thermal Analysis Considering Nonlinear Thermal Conductivity. ISQED (2006)
Sani R. Nassif
Model to hardware matching: for nano-meter scale technologies. ISLPED (2006)
Bin Zhang, Ari Arapostathis, Sani R. Nassif, Michael Orshansky
Analytical modeling of SRAM dynamic stability. ICCAD (2006)
Sani R. Nassif, Kanak Agarwal, Emrah Acar
Methods for estimating decoupling capacitance of nonswitching circuit blocks. ISCAS (2006)
Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, Dennis Sylvester, Clive Bittlestone, Riko Radojcic
Variation-aware analysis: savior of the nanometer era? DAC (2006)
Anand Ramalingam, Gi-Joon Nam, Ashish Kumar Singh, Michael Orshansky, Sani R. Nassif, David Z. Pan
An accurate sparse matrix based framework for statistical static timing analysis. ICCAD (2006)
T. M. Mak, Sani R. Nassif
Guest Editors' Introduction: Process Variation and Stochastic Design and Test. IEEE Des. Test Comput. 23 (6) (2006)
Emrah Acar, Kanak Agarwal, Sani R. Nassif
Characterization of total chip leakage using inverse (reciprocal) gamma distribution. ISCAS (2006)
Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif
Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events. DAC (2006)

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Publication Activity (10 Years)

Top Topics

Top Venues

Sani R. Nassif