Bryan J. Robbins

Publication Activity (10 Years)

Years Active: 1997-2010
Publications (10 Years): 0

Publications

Jente B. Kuang, Jeremy D. Schaub, Fadi H. Gebara, Dieter F. Wendel, Sudesh Saroop, Tuyet Nguyen, Thomas Fröhnel, Antje Müller, Christopher M. Durham, Rolf Sautter, Bryan Lloyd, Bryan J. Robbins, Juergen Pille, Sani R. Nassif, Kevin J. Nowka
A 32nm 0.5V-supply dual-read 6T SRAM. CICC (2010)
G. Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur
Structural and functional test of IBM System z10 chips. IBM J. Res. Dev. 53 (1) (2009)
Richard F. Rizzolo, Thomas G. Foote, James M. Crafts, David A. Grosch, Tak O. Leung, David J. Lund, Bryan L. Mechtly, Bryan J. Robbins, Timothy J. Slegel, Michael J. Tremblay, Glen A. Wiedemeier
IBM System z9 eFUSE applications and methodology. IBM J. Res. Dev. 51 (1/2) (2007)
Mary P. Kusko, Bryan J. Robbins, Timothy J. Koprowski, William V. Huott
99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor. ITC (2001)
Mary P. Kusko, Bryan J. Robbins, Thomas J. Snethen, Peilin Song, Thomas G. Foote, William V. Huott
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip. ITC (1998)
Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins
Testing the 500-MHz IBM S/390 Microprocessor. IEEE Des. Test Comput. 15 (3) (1998)
William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen
Advanced microprocessor test strategy and methodology. IBM J. Res. Dev. 41 (4&5) (1997)
Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko
Testing the 400-MHz IBM Generation-4 CMOS Chip. ITC (1997)