Login / Signup

Structural and functional test of IBM System z10 chips.

G. SalemD. W. WittigThomas G. FooteBryan J. RobbinsC. HirkoDonato O. ForlenzaFranco MotikaJ. A. KyleMary P. KuskoOrazio P. ForlenzaR. J. FrishmuthRona YaariS. MichnowskiU. Baur
Published in: IBM J. Res. Dev. (2009)
Keyphrases
  • high speed
  • structural information
  • operating system
  • integrated circuit
  • neural network
  • information retrieval
  • computer systems
  • input output
  • statistical significance
  • test suite
  • functional units
  • ibm zenterprise