Dale E. Hoffman

Publication Activity (10 Years)

Years Active: 1988-2002
Publications (10 Years): 0

Publications

Dale E. Hoffman
Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. ITC (2002)
Robert M. Averill III, Keith G. Barkley, Michael A. Bowen, Peter J. Camporese, Allan H. Dansky, Robert F. Hatch, Dale E. Hoffman, Mark D. Mayo, Scott A. McCabe, Timothy G. McNamara, Thomas J. McPherson, Gregory A. Northrop, Leon J. Sigal, Howard H. Smith, David A. Webber, Patrick M. Williams
Chip integration methodology for the IBM S/390 G5 and G6 custom microprocessors. IBM J. Res. Dev. 43 (5) (1999)
Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins
Testing the 500-MHz IBM S/390 Microprocessor. IEEE Des. Test Comput. 15 (3) (1998)
Dale E. Hoffman, Robert M. Averill III, Brian W. Curran, Yuen H. Chan, Allan H. Dansky, Robert F. Hatch, Timothy G. McNamara, Thomas J. McPherson, Gregory A. Northrop, Leon J. Sigal, Anthony Pelella, Patrick M. Williams
Deep submicron design techniques for the 500 MHz IBM S/390 G5 custom microprocessor. ICCD (1998)
Kenneth L. Shepard, Sean M. Carey, Ee Kin Cho, Brian W. Curran, Robert F. Hatch, Dale E. Hoffman, Scott A. McCabe, Gregory A. Northrop, A. E. (Rick) Seigler
Design methodology for the S/390 Parallel Enterprise Server G4 microprocessors. IBM J. Res. Dev. 41 (4&5) (1997)
William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen
Advanced microprocessor test strategy and methodology. IBM J. Res. Dev. 41 (4&5) (1997)
Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko
Testing the 400-MHz IBM Generation-4 CMOS Chip. ITC (1997)
Algirdas J. Gruodis, Dale E. Hoffman
250-MHz advanced test systems. IEEE Des. Test 5 (2) (1988)