Testing the 400-MHz IBM Generation-4 CMOS Chip.

Thomas G. Foote Dale E. Hoffman William V. Huott Timothy J. Koprowski Bryan J. Robbins Mary P. Kusko

Published in: ITC (1997)

Keyphrases

high speed
cmos technology
nm technology
analog vlsi
low power
low cost
circuit design
power consumption
cmos image sensor
single chip
power dissipation
image sensor
low voltage
random access memory
test cases
focal plane
software testing
generation process
high frequency
magnetic tape
real time