Rajeshwary Tayade

Publication Activity (10 Years)

Years Active: 2004-2009
Publications (10 Years): 0

Publications

Rajeshwary Tayade, Jacob A. Abraham
Critical Path Selection for Delay Testing Considering Coupling Noise. J. Electron. Test. 25 (4-5) (2009)
Rajeshwary Tayade, Jacob A. Abraham
Critical Path Selection for Delay Test Considering Coupling Noise. ETS (2009)
Rajeshwary Tayade, Jacob A. Abraham
On-chip Programmable Capture for Accurate Path Delay Test and Characterization. ITC (2008)
Rajeshwary Tayade, Sani R. Nassif, Jacob A. Abraham
Analytical model for the impact of multiple input switching noise on timing. ASP-DAC (2008)
Rajeshwary Tayade, Jacob A. Abraham
Small-delay defect detection in the presence of process variations. Microelectron. J. 39 (8) (2008)
Rajeshwary Tayade, Jacob A. Abraham
Critical Path Selection for Delay Test Considering Coupling Noise. ETS (2008)
Rajeshwary Tayade, Vijay Kiran Kalyanam, Sani R. Nassif, Michael Orshansky, Jacob A. Abraham
Estimating path delay distribution considering coupling noise. ACM Great Lakes Symposium on VLSI (2007)
Rajeshwary Tayade, Savithri Sundareswaran, Jacob A. Abraham
Small-Delay Defect Detection in the Presence of Process Variations. ISQED (2007)
Rajeshwary Tayade, Gwan Choi
Fast Simulation Technique for LDPC Code Analysis. International Conference on Wireless Networks (2004)