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Critical Path Selection for Delay Test Considering Coupling Noise.

Rajeshwary TayadeJacob A. Abraham
Published in: ETS (2008)
Keyphrases
  • critical path
  • job shop scheduling problem
  • noisy data
  • noise level
  • random noise
  • signal to noise ratio
  • machine learning
  • genetic algorithm
  • optimal solution
  • missing data
  • noise reduction