Anne Gattiker

Publication Activity (10 Years)

Years Active: 2006-2019
Publications (10 Years): 1

Top Topics

Controlled Natural Language

Ibm Zenterprise

Physical Design

Top Venues

IEEE J. Solid State Circuits

Publications

Mayoore Jaiswal, H. Peter Hofstee, Valerie Chen, Suvadip Paul, Rogério Feris, Frank Liu, Anupama Jagannathan, Anne Gattiker, Inseok Hwang, Jinho Lee, Matthew Tong, Sahil Dureja, Soham Shah
Video-Text Compliance: Activity Verification Based on Natural Language Instructions. ICCV Workshops (2019)
Eric J. Fluhr, Steve Baumgartner, David W. Boerstler, John F. Bulzacchelli, Timothy Diemoz, Daniel Dreps, George English, Joshua Friedrich, Anne Gattiker, Tilman Gloekler, Christopher J. Gonzalez, Jason Hibbeler, Keith A. Jenkins, Yong Kim, Paul Muench, Ryan Nett, Jose Paredes, Juergen Pille, Donald W. Plass, Phillip J. Restle, Raphael Robertazzi, David Shan, David W. Siljenberg, Michael A. Sperling, Kevin Stawiasz, Gregory S. Still, Zeynep Toprak Deniz, James D. Warnock, Glen A. Wiedemeier, Victor V. Zyuban
The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking. IEEE J. Solid State Circuits 50 (1) (2015)
James D. Warnock, Yuen H. Chan, Hubert Harrer, Sean M. Carey, Gerard Salem, Doug Malone, Ruchir Puri, Jeffrey A. Zitz, Adam Jatkowski, Gerald Strevig, Ayan Datta, Anne Gattiker, Aditya Bansal, Guenter Mayer, Yiu-Hing Chan, Mark D. Mayo, David L. Rude, Leon J. Sigal, Thomas Strach, Howard H. Smith, Huajun Wen, Pak-kin Mak, Chung-Lung Kevin Shum, Donald W. Plass, Charles F. Webb
Circuit and Physical Design of the zEnterprise™ EC12 Microprocessor Chips and Multi-Chip Module. IEEE J. Solid State Circuits 49 (1) (2014)
Anne Gattiker
Big data and test. ITC (2014)
Anne Gattiker
Unstructured text: Test analysis techniques applied to non-test problems. VTS (2014)
James D. Warnock, Yuen H. Chan, Hubert Harrer, David L. Rude, Ruchir Puri, Sean M. Carey, Gerard Salem, Guenter Mayer, Yiu-Hing Chan, Mark D. Mayo, Adam Jatkowski, Gerald Strevig, Leon J. Sigal, Ayan Datta, Anne Gattiker, Aditya Bansal, Doug Malone, Thomas Strach, Huajun Wen, Pak-kin Mak, Chung-Lung Kevin Shum, Donald W. Plass, Charles F. Webb
5.5GHz system z microprocessor and multi-chip module. ISSCC (2013)
Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham
An oscillation-based test structure for timing information extraction. VTS (2012)
Anne Gattiker
Invited paper: Yin and Yang of embedded sensors for post-scaling-era. VTS (2011)
Anne Gattiker
System-level impact of chip-level failure mechanisms and screens. ICCAD (2010)
Anne Gattiker
Using test data to improve IC quality and yield. ICCAD (2008)
Anne Gattiker
Unraveling Variability for Process/Product Improvement. ITC (2008)
Anne Gattiker
Guest Editor's Introduction: Getting More Out of Test. IEEE Des. Test Comput. 24 (5) (2007)
Anne Gattiker, Manjul Bhushan, Mark B. Ketchen
Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment. ITC (2006)