Keith A. Jenkins

Publication Activity (10 Years)

Years Active: 1996-2018
Publications (10 Years): 7

Top Topics

Cmos Technology

Noisy Measurements

Special Purpose Hardware

Top Venues

Microelectron. Reliab.

Publications

Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. IRPS (2018)
C. Zhou, Keith A. Jenkins, P. I. Chuang, Christos Vezyrtzis
Effect of HCI degradation on the variability of MOSFETS. IRPS (2018)
Bruce M. Fleischer, Christos Vezyrtzis, Karthik Balakrishnan, Keith A. Jenkins
A statistical critical path monitor in 14nm CMOS. ICCD (2016)
Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. IRPS (2015)
Eric J. Fluhr, Steve Baumgartner, David W. Boerstler, John F. Bulzacchelli, Timothy Diemoz, Daniel Dreps, George English, Joshua Friedrich, Anne Gattiker, Tilman Gloekler, Christopher J. Gonzalez, Jason Hibbeler, Keith A. Jenkins, Yong Kim, Paul Muench, Ryan Nett, Jose Paredes, Juergen Pille, Donald W. Plass, Phillip J. Restle, Raphael Robertazzi, David Shan, David W. Siljenberg, Michael A. Sperling, Kevin Stawiasz, Gregory S. Still, Zeynep Toprak Deniz, James D. Warnock, Glen A. Wiedemeier, Victor V. Zyuban
The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking. IEEE J. Solid State Circuits 50 (1) (2015)
Tony Tae-Hyoung Kim, Pong-Fei Lu, Keith A. Jenkins, Chris H. Kim
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology. IEEE Trans. Very Large Scale Integr. Syst. 23 (7) (2015)
Pong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology. IRPS (2015)
Phillip J. Restle, David Shan, David Hogenmiller, Yong Kim, Alan J. Drake, Jason Hibbeler, Thomas J. Bucelot, Gregory S. Still, Keith A. Jenkins, Joshua Friedrich
microprocessor. ISSCC (2014)
Pong-Fei Lu, Keith A. Jenkins, Tobias Webel, Oliver Marquardt, Birgit Schubert
Long-term NBTI degradation under real-use conditions in IBM microprocessors. Microelectron. Reliab. 54 (11) (2014)
Keith A. Jenkins, Pong-Fei Lu
On-chip circuit to monitor long-term NBTI and PBTI degradation. Microelectron. Reliab. 53 (9-11) (2013)
Keith A. Jenkins, Phillip J. Restle, P. Z. Wang, D. Hogenmiller, David W. Boerstler, Thomas J. Bucelot
On-chip circuit for measuring multi-GHz clock signal waveforms. VTS (2013)
Jente B. Kuang, Keith A. Jenkins, Kevin Stawiasz, Jeremy D. Schaub
Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators. ESSCIRC (2013)
Karthik Balakrishnan, Keith A. Jenkins, Duane S. Boning
A simple array-based test structure for the AC variability characterization of MOSFETs. ISQED (2011)
Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim
A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry. IEEE J. Solid State Circuits 44 (9) (2009)
Keith A. Jenkins, Lionel Li
A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset. VTS (2009)
Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy
An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process. IEEE J. Solid State Circuits 43 (9) (2008)
Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim
A Completely Digital On-Chip Circuit for Local-Random-Variability Measurement. ISSCC (2008)
Woogeun Rhee, Keith A. Jenkins, John C. Liobe, Herschel A. Ainspan
Experimental Analysis of Substrate Noise Effect on PLL Performance. IEEE Trans. Circuits Syst. II Express Briefs (7) (2008)
Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy
Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure. ISSCC (2007)
Keith A. Jenkins, Kenneth L. Shepard, Zheng Xu
On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution Networks. CICC (2007)
Keith A. Jenkins, Anup P. Jose, David F. Heidel
An on-chip jitter measurement circuit with sub-picosecond resolution. ESSCIRC (2005)
John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang
Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection. IBM J. Res. Dev. 49 (4-5) (2005)
Anup P. Jose, Keith A. Jenkins, Scott K. Reynolds
On-Chip Spectrum Analyzer for Analog Built-In Self Test. VTS (2005)
Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho
CMOS IC diagnostics using the luminescence of OFF-state leakage currents. ITC (2004)
Tian Xia, Peilin Song, Keith A. Jenkins, Jien-Chung Lo
Delay chain based programmable jitter generator. ETS (2004)
Jean-Olivier Plouchart, Noah Zamdmer, Jonghae Kim, Melanie Sherony, Yue Tan, Asit Ray, Mohamed Talbi, Lawrence F. Wagner, Kun Wu, Naftali E. Lustig, Shreesh Narasimha, Patricia O'Neil, Nghia Phan, Michael Rohn, James Strom, David M. Friend, Stephen V. Kosonocky, Daniel R. Knebel, Suhwan Kim, Keith A. Jenkins, Michel M. Rivier
Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits. IBM J. Res. Dev. 47 (5-6) (2003)
Phillip J. Restle, Timothy G. McNamara, David A. Webber, Peter J. Camporese, Kwok F. Eng, Keith A. Jenkins, David H. Allen, Michael J. Rohn, Michael P. Quaranta, David W. Boerstler, Charles J. Alpert, Craig A. Carter, Roger N. Bailey, John G. Petrovick, Byron L. Krauter, Bradley D. McCredie
A clock distribution network for microprocessors. IEEE J. Solid State Circuits 36 (5) (2001)
Keith A. Jenkins, James P. Eckhardt
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops. IEEE Des. Test Comput. 17 (2) (2000)
Phillip J. Restle, Keith A. Jenkins, Alina Deutsch, Peter W. Cook
Measurement and modeling of on-chip transmission line effects in a 400 MHz microprocessor. IEEE J. Solid State Circuits 33 (4) (1998)
Stephen V. Kosonocky, Arthur A. Bright, Kevin W. Warren, Ruud A. Haring, Steve Klepner, Sameh W. Asaad, S. Basavaiah, Bob Havreluk, David F. Heidel, Michael Immediato, Keith A. Jenkins, Rajiv V. Joshi, Benjamin D. Parker, T. V. Rajeevakumar, Kevin Stawiasz
Designing a Testable System on a Chip. VTS (1998)
Joachim N. Burghartz, Daniel C. Edelstein, Mehmet Soyuer, Herschel A. Ainspan, Keith A. Jenkins
RF circuit design aspects of spiral inductors on silicon. IEEE J. Solid State Circuits 33 (12) (1998)
Joachim N. Burghartz, Mehmet Soyuer, Keith A. Jenkins, Michael Kies, Margaret Dolan, Kenneth J. Stein, John Malinowski, David L. Harame
Integrated RF components in a SiGe bipolar technology. IEEE J. Solid State Circuits 32 (9) (1997)
Mehmet Soyuer, Joachim N. Burghartz, Herschel A. Ainspan, Keith A. Jenkins, Peter Xiao, Arvin R. Shahani, Margaret S. Dolan, David L. Harame
An 11 GHz 3-V SiGe voltage controlled oscillator with integrated resonator. IEEE J. Solid State Circuits 32 (9) (1997)
Keith A. Jenkins
Detecting and Preventing Measurement Errors. IEEE Des. Test Comput. 14 (4) (1997)
Mehmet Soyuer, Keith A. Jenkins, Joachim N. Burghartz, Michael D. Hulvey
A 3-V 4-GHz nMOS voltage-controlled oscillator with integrated resonator. IEEE J. Solid State Circuits 31 (12) (1996)
Mehmet Soyuer, Keith A. Jenkins, Joachim N. Burghartz, Herschel A. Ainspan, Frank J. Canora, Slaila Ponnapalli, John F. Ewen, William E. Pence
A 2.4-GHz silicon bipolar oscillator with integrated resonator. IEEE J. Solid State Circuits 31 (2) (1996)