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Estimating transistor channel temperature using time-resolved and time-integrated NIR emission.

Franco StellariAlan J. WegerKeith A. JenkinsGiuseppe La RosaBarry P. LinderPeilin Song
Published in: IRPS (2018)
Keyphrases
  • high speed
  • digital camera
  • multi channel
  • multispectral
  • rigid body
  • multiple access
  • low power
  • integrated circuit
  • energy saving
  • visible light