Franco Stellari

Publication Activity (10 Years)

Years Active: 2001-2022
Publications (10 Years): 8

Top Topics

Mahalanobis Distance

Semiconductor Devices

Security Policies

Diagnostic Tests

Top Venues

Publications

Franco Stellari, Ernest Y. Wu, Martin M. Frank, Leonidas E. Ocala, Takashi Ando, Peilin Song
Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation. ESSDERC (2022)
Franco Stellari, Peilin Song
Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security. ITC (2022)
Benjamin Tan, Ramesh Karri, Nimisha Limaye, Abhrajit Sengupta, Ozgur Sinanoglu, Md Moshiur Rahman, Swarup Bhunia, Danielle Duvalsaint, Ronald D. Blanton, Amin Rezaei, Yuanqi Shen, Hai Zhou, Leon Li, Alex Orailoglu, Zhaokun Han, Austin Benedetti, Luciano Brignone, Muhammad Yasin, Jeyavijayan Rajendran, Michael Zuzak, Ankur Srivastava, Ujjwal Guin, Chandan Karfa, Kanad Basu, Vivek V. Menon, Matthew French, Peilin Song, Franco Stellari, Gi-Joon Nam, Peter Gadfort, Alric Althoff, Joseph Tostenrude, Saverio Fazzari, Eric Breckenfeld, Kenneth Plaks
Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking. CoRR (2020)
Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song
Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. VTS (2019)
Uma Srinivasan, William V. Huott, Chad Adams, Pete Freiburger, Franco Stellari, Peilin Song, Phong Tran, Dave Albert
Case Study of Advanced Diagnostic Techniques for Multi Port Register File. NATW (2019)
Franco Stellari, Naigang Wang, Peilin Song
Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress. ESSDERC (2018)
Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. IRPS (2018)
Franco Stellari, Peilin Song, Manuel Villalobos, John Sylvestri
Revealing SRAM memory content using spontaneous photon emission. VTS (2016)
Andrea Bahgat Shehata, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted R. Lundquist, Euan Ramsay
Time-integrated photon emission as a function of temperature in 32 nm CMOS. IRPS (2015)
Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. IRPS (2015)
Franco Stellari, Peilin Song, Alan J. Weger, Jim Culp, A. Herbert, Dirk Pfeiffer
Verification of untrusted chips using trusted layout and emission measurements. HOST (2014)
Peilin Song, Franco Stellari, Alan J. Weger
Counterfeit IC detection using light emission. ITC (2014)
Franco Stellari, Peilin Song, Herschel A. Ainspan
Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements. VTS (2014)
Peilin Song, Franco Stellari
Tester-based optical and electrical diagnostic system and techniques. VTS (2012)
Franco Stellari, Thomas Cowell, Peilin Song, Michael Sorna, Zeynep Toprak Deniz, John F. Bulzacchelli, Nandita A. Mitra
Root cause identification of an hard-to-find on-chip power supply coupling fail. ITC (2012)
Peilin Song, Franco Stellari, Dirk Pfeiffer, Jim Culp, Alan J. Weger, Alyssa Bonnoit, Bob Wisnieff, Marc Taubenblatt
MARVEL - Malicious alteration recognition and verification by emission of light. HOST (2011)
Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy
Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. (8) (2010)
Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza
On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). ITC (2009)
Peilin Song, Stephen Ippolito, Franco Stellari, John Sylvestri, Tim Diemoz, George Smith, Paul Muench, Norm James, Seongwon Kim, Hector Saenz
Optical Diagnostics for IBM POWER6- Microprocessor. ITC (2008)
Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy
A high sensitivity process variation sensor utilizing sub-threshold operation. CICC (2008)
Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steve Wilson, John Pennings, Richard F. Rizzolo
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. ITC (2006)
Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus
An advanced optical diagnostic technique of IBM z990 eServer microprocessor. ITC (2005)
Franco Stellari, Peilin Song, John Hryckowian, Otto A. Torreiter, Steve Wilson, Philip Wu, Alberto Tosi
Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE). Microelectron. Reliab. 45 (9-11) (2005)
Alberto Tosi, Franco Stellari, Franco Zappa
Innovative packaging technique for backside optical testing of wire-bonded chips. Microelectron. Reliab. 45 (9-11) (2005)
Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. ITC (2004)
Franco Stellari, Alberto Tosi, Franco Zappa, Sergio Cova
CMOS circuit testing via time-resolved luminescence measurements and simulations. IEEE Trans. Instrum. Meas. 53 (1) (2004)
Alberto Tosi, Franco Stellari, Franco Zappa
Current crowding in faulty MOSFET: optical and electrical investigation. Microelectron. Reliab. 44 (9-11) (2004)
Franco Stellari, Peilin Song
Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD). Microelectron. Reliab. 44 (9-11) (2004)
Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson
Latchup Analysis Using Emission Microscopy. Microelectron. Reliab. 43 (9-11) (2003)
Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43 (9-11) (2003)
Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda
Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC (2003)
Alberto Tosi, Franco Stellari, Franco Zappa, Sergio Cova
Backside Flip-Chip testing by means of high-bandwidth luminescence detection. Microelectron. Reliab. 43 (9-11) (2003)
Franco Stellari, Peilin Song, James C. Tsang, Moyra K. McManus, Mark B. Ketchen
in low power CMOS circuits. Microelectron. Reliab. 42 (9-11) (2002)
Franco Stellari, Franco Zappa, Sergio Cova, L. Vendrame
Tools for contactless testing and simulation of CMOS circuits. Microelectron. Reliab. 41 (11) (2001)