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Backside Flip-Chip testing by means of high-bandwidth luminescence detection.
Alberto Tosi
Franco Stellari
Franco Zappa
Sergio Cova
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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high bandwidth
end to end
high density
low latency
application specific
fiber optic
high speed
data acquisition
high throughput
virtual machine
mobile terminals