Alberto Tosi

Publication Activity (10 Years)

Years Active: 2003-2024
Publications (10 Years): 11

Top Topics

Photon Counting

Top Venues

Publications

Davide Moschella, Davide Berretta, Alberto Tosi, Federica A. Villa
A 64 × 64 SPAD Array For Quantum Ghost Imaging with Integrated TDCs and Event-Driven Readout in a 40 nm CMOS Technology. PRIME (2024)
Domenico Ribezzo, Mujtaba Zahidy, Antoine Petitjean, Gianmarco Lemmi, Claudia De Lazzari, Ilaria Vagniluca, Enrico Conca, Alberto Tosi, Tommaso Occhipinti, Francesco Saverio Cataliotti, Leif K. Oxenløwe, André Xuereb, Davide Bacco, Alessandro Zavatta
QKD protocol over 100 km long submarine optical fiber assisted by a system-in-package fast-gated InGaAs single photon detector. OFC (2023)
Kevin Andres Herrera Pesantes, Enrico Conca, Simone Riccardo, Fabio Telesca, Fabio Signorelli, Alberto Tosi
8-Channel Time-of-Flight Single-Photon Detection Module Based on InGaAs/InP SPAD Array. PRIME (2023)
Caterina Amendola, Michele Lacerenza, Mauro Buttafava, Alberto Tosi, Lorenzo Spinelli, Davide Contini, Alessandro Torricelli
A Compact Multi-Distance DCS and Time Domain NIRS Hybrid System for Hemodynamic and Metabolic Measurements. Sensors 21 (3) (2021)
Atul Ingle, Trevor Seets, Mauro Buttafava, Shantanu Gupta, Alberto Tosi, Mohit Gupta, Andreas Velten
Passive Inter-Photon Imaging. CoRR (2021)
Atul Ingle, Trevor Seets, Mauro Buttafava, Shantanu Gupta, Alberto Tosi, Mohit Gupta, Andreas Velten
Passive Inter-Photon Imaging. CVPR (2021)
Enrico Conca, Vincenzo Sesta, Mauro Buttafava, Federica A. Villa, Laura Di Sieno, Alberto Dalla Mora, Davide Contini, Paola Taroni, Alessandro Torricelli, Antonio Pifferi, Franco Zappa, Alberto Tosi
Large-Area, Fast-Gated Digital SiPM With Integrated TDC for Portable and Wearable Time-Domain NIRS. IEEE J. Solid State Circuits 55 (11) (2020)
Vincenzo Sesta, Federica A. Villa, Enrico Conca, Alberto Tosi
A novel sub-10 ps resolution TDC for CMOS SPAD array. ICECS (2018)
Mirko Sanzaro, Fabio Signorelli, Paolo Gattari, Alberto Tosi, Franco Zappa
0.16 µm-BCD Silicon Photomultipliers with Sharp Timing Response and Reduced Correlated Noise. Sensors 18 (11) (2018)
Adithya Kumar Pediredla, Mauro Buttafava, Alberto Tosi, Oliver Cossairt, Ashok Veeraraghavan
Reconstructing rooms using photon echoes: A plane based model and reconstruction algorithm for looking around the corner. ICCP (2017)
Danilo Bronzi, Yu Zou, Federica A. Villa, Simone Tisa, Alberto Tosi, Franco Zappa
Automotive Three-Dimensional Vision Through a Single-Photon Counting SPAD Camera. IEEE Trans. Intell. Transp. Syst. 17 (3) (2016)
Alberto Tosi, Mirko Sanzaro, Niccolo Calandri, Alessandro Ruggeri, Fabio Acerbi
Low dark count rate and low timing jitter InGaAs/InP Single-Photon Avalanche Diode. ESSDERC (2014)
Bojan Markovic, Simone Tisa, Federica A. Villa, Alberto Tosi, Franco Zappa
A High-Linearity, 17 ps Precision Time-to-Digital Converter Based on a Single-Stage Vernier Delay Loop Fine Interpolation. IEEE Trans. Circuits Syst. I Regul. Pap. (3) (2013)
Danilo Bronzi, Federica A. Villa, Simone Bellisai, Bojan Markovic, Simone Tisa, Alberto Tosi, Franco Zappa, Sascha Weyers, Daniel Durini, Werner Brockherde, Uwe Paschen
Low-noise and large-area CMOS SPADs with timing response free from slow tails. ESSDERC (2012)
Bojan Markovic, Simone Tisa, Alberto Tosi, Franco Zappa
Monolithic single-photon detectors and time-to-digital converters for picoseconds time-of-flight ranging. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications (2011)
F. Guerrieri, Simone Tisa, Alberto Tosi, Simone Bellisai, Bojan Markovic, Franco Zappa
Linear arrays of single-photon detectors for photon counting and timing. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications (2011)
Franco Stellari, Peilin Song, John Hryckowian, Otto A. Torreiter, Steve Wilson, Philip Wu, Alberto Tosi
Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE). Microelectron. Reliab. 45 (9-11) (2005)
Alberto Tosi, Franco Stellari, Franco Zappa
Innovative packaging technique for backside optical testing of wire-bonded chips. Microelectron. Reliab. 45 (9-11) (2005)
Franco Stellari, Alberto Tosi, Franco Zappa, Sergio Cova
CMOS circuit testing via time-resolved luminescence measurements and simulations. IEEE Trans. Instrum. Meas. 53 (1) (2004)
Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu
Implementation of TRE systems into Emission Microscopes. Microelectron. Reliab. 44 (9-11) (2004)
Alberto Tosi, Franco Stellari, Franco Zappa
Current crowding in faulty MOSFET: optical and electrical investigation. Microelectron. Reliab. 44 (9-11) (2004)
Alberto Tosi, Franco Stellari, Franco Zappa, Sergio Cova
Backside Flip-Chip testing by means of high-bandwidth luminescence detection. Microelectron. Reliab. 43 (9-11) (2003)