Philippe Perdu

Publication Activity (10 Years)

Years Active: 2001-2018
Publications (10 Years): 11

Top Topics

Image Enhancement

Electro Optical

Unsupervised Learning

Wavelet Transform

Top Venues

Microelectron. Reliab.

Signal Image Video Process.

J. Electronic Imaging

Publications

Anthony Boscaro, Sabir Jacquir, Samuel Chef, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
Automatic localization of signal sources in photon emission images for integrated circuit analysis. Signal Image Video Process. 12 (4) (2018)
Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory. FUSION (2017)
Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
Pattern image enhancement by automatic focus correction. Microelectron. Reliab. (2017)
Anthony Boscaro, Sabir Jacquir, K. Melendez, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
Automatic process for time-frequency scan of VLSI. Microelectron. Reliab. 64 (2016)
C. T. Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. Microelectron. Reliab. 64 (2016)
Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location. J. Electronic Imaging 24 (1) (2015)
Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering. Microelectron. Reliab. 55 (9-10) (2015)
Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak, Chee Lip Gan
Unsupervised learning for signal mapping in dynamic photon emission. Microelectron. Reliab. 55 (9-10) (2015)
K. Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis
A way to implement the electro-optical technique to inertial MEMS. Microelectron. Reliab. 55 (9-10) (2015)
Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier
Editorial. Microelectron. Reliab. 55 (9-10) (2015)
Nicolas Courjault, Philippe Perdu, Fulvio Infante, Thierry Lebey, Vincent Bley
Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization. Microelectron. Reliab. 55 (9-10) (2015)
Samuel Chef, Bastien Billiot, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
Pattern image enhancement by extended depth of field. Microelectron. Reliab. 54 (9-10) (2014)
Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis
A comprehensive study of the application of the EOP techniques on bipolar devices. Microelectron. Reliab. 54 (9-10) (2014)
Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki
Backside spectroscopic photon emission microscopy using intensified silicon CCD. Microelectron. Reliab. 54 (9-10) (2014)
I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. Microelectron. Reliab. 53 (9-11) (2013)
Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
Frequency mapping in dynamic light emission with wavelet transform. Microelectron. Reliab. 53 (9-11) (2013)
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
Optimum Si thickness for backside detection of photon emission using Si-CCD. Microelectron. Reliab. 52 (9-10) (2012)
Guillaume Bascoul, Philippe Perdu, Maryse Béguin, Dean Lewis
High performance thermography with InGaAs photon counting camera. Microelectron. Reliab. 52 (9-10) (2012)
Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. Microelectron. Reliab. 51 (9-11) (2011)
Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. Microelectron. Reliab. 51 (9-11) (2011)
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. Microelectron. Reliab. 51 (9-11) (2011)
Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. Microelectron. Reliab. 51 (9-11) (2011)
Fulvio Infante, Philippe Perdu, Dean Lewis
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. Microelectron. Reliab. 50 (9-11) (2010)
Jerome Di-Battista, Jean-Christophe Courrège, Bruno Rouzeyre, Lionel Torres, Philippe Perdu
When Failure Analysis Meets Side-Channel Attacks. CHES (2010)
A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis
CADless laser assisted methodologies for failure analysis and device reliability. Microelectron. Reliab. 50 (9-11) (2010)
Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). Microelectron. Reliab. 50 (9-11) (2010)
Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura
VLSI functional analysis by dynamic emission microscopy. Microelectron. Reliab. 50 (9-11) (2010)
Fulvio Infante, Philippe Perdu, Dean Lewis
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. Microelectron. Reliab. 49 (9-11) (2009)
F. Molière, B. Foucher, Philippe Perdu, Alain Bravaix
Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics. Microelectron. Reliab. 49 (9-11) (2009)
Mohsine Bouya, Nathalie Malbert, Nathalie Labat, D. Carisetti, Philippe Perdu, J. C. Clement, Benoit Lambert, M. Bonnet
Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques. Microelectron. Reliab. 48 (8-9) (2008)
Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier
Generic simulator for faulty IC. Microelectron. Reliab. 48 (8-9) (2008)
M. Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Microelectron. Reliab. 48 (8-9) (2008)
Antoine Reverdy, Philippe Perdu, H. Murray, M. de la Bardonnie, Patrick Poirier
Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology. Microelectron. Reliab. 48 (8-9) (2008)
Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48 (8-9) (2008)
Antoine Reverdy, M. de la Bardonnie, Patrick Poirier, H. Murray, Philippe Perdu, A. Boukkali
Dynamic study of the thermal laser stimulation response on advanced technology structures. Microelectron. Reliab. 48 (10) (2008)
Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis
Identification of process/design issues during 0.18 µm technology qualification for space application. DATE (2007)
A. Crosson, Laurent Escotte, Marise Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, Guy Perez
Long-term reliability of silicon bipolar transistors subjected to low constraints. Microelectron. Reliab. 47 (9-11) (2007)
Mohsine Bouya, D. Carisetti, Nathalie Malbert, Nathalie Labat, Philippe Perdu, J. C. Clement, M. Bonnet, G. Pataut
Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC. Microelectron. Reliab. 47 (9-11) (2007)
Felix Beaudoin, Kevin Sanchez, Philippe Perdu
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. Microelectron. Reliab. 47 (9-11) (2007)
Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. 46 (9-11) (2006)
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46 (9-11) (2006)
Christophe De Nardi, Romain Desplats, Philippe Perdu, Jean-Luc Gauffier, Christophe Guérin
Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectron. Reliab. 46 (9-11) (2006)
C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier
Oxide charge measurements in EEPROM devices. Microelectron. Reliab. 45 (9-11) (2005)
Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu
Failure analysis of micro-heating elements suspended on thin membranes. Microelectron. Reliab. 45 (9-11) (2005)
Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45 (9-11) (2005)
Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte
Dynamic Laser Stimulation Case Studies. Microelectron. Reliab. 45 (9-11) (2005)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45 (9-11) (2005)
Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectron. Reliab. 45 (9-11) (2005)
Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu
Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS (2005)
Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45 (9-11) (2005)
Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? Microelectron. Reliab. 44 (9-11) (2004)
Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44 (9-11) (2004)
Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis
Time Resolved Photon Emission Processing Flow for IC Analysis. Microelectron. Reliab. 44 (9-11) (2004)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44 (9-11) (2004)
Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu
Femtosecond Laser Ablation for Backside Silicon Thinning. Microelectron. Reliab. 44 (9-11) (2004)
Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis
Study of the ESD defects impact on ICs reliability. Microelectron. Reliab. 44 (9-11) (2004)
Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu
Implementation of TRE systems into Emission Microscopes. Microelectron. Reliab. 44 (9-11) (2004)
Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. Microelectron. Reliab. 44 (9-11) (2004)
David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectron. Reliab. 43 (1) (2003)
Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43 (1) (2003)
Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43 (3) (2003)
Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43 (9-11) (2003)
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43 (9-11) (2003)
Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43 (9-11) (2003)
Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu
Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectron. Reliab. 43 (9-11) (2003)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah
Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC (2003)
Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectron. Reliab. 43 (9-11) (2003)
Olivier Crépel, C. Goupil, Bernadette Domengès, Philippe Descamps, Philippe Perdu, A. Doukkali
Magnetic field measurements for Non Destructive Failure Analysis. Microelectron. Reliab. 42 (9-11) (2002)
Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42 (9-11) (2002)
Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectron. Reliab. 42 (9-11) (2002)
Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats
IR confocal laser microscopy for MEMS Technological Evaluation. Microelectron. Reliab. 42 (9-11) (2002)
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42 (9-11) (2002)
Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis
Silicon Thinning and Polishing on Packaged Devices. Microelectron. Reliab. 41 (9-10) (2001)
Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu
Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology. IEEE J. Solid State Circuits 36 (9) (2001)
Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis
Modeling Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)
Romain Desplats, Philippe Perdu, Felix Beaudoin
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectron. Reliab. 41 (9-10) (2001)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)
Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41 (9-10) (2001)