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Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory.

Anthony BoscaroSabir JacquirKevin SanchezPhilippe PerduStéphane Binczak
Published in: FUSION (2017)
Keyphrases
  • vlsi circuits
  • data fusion
  • semi automatic
  • low power
  • case study
  • digital images
  • low cost
  • information fusion
  • image fusion
  • evidential reasoning
  • optic disc