Olivier Crépel

Publication Activity (10 Years)

Years Active: 2002-2021
Publications (10 Years): 2

Top Topics

Power Distribution Systems

Simulation Models

Top Venues

Microelectron. Reliab.

Publications

Fabio Principato, Giuseppe Allegra, Corrado Cappello, Olivier Crépel, Nicola Nicosia, Salvatore D'Arrigo, Vincenzo Cantarella, Alessandro Di Mauro, Leonardo Abbene, Marcello Mirabello, Francesco Pintacuda
Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs lifetime by Reliability Tests. Sensors 21 (16) (2021)
Moustafa Zerarka, Olivier Crépel
Radiation robustness of normally-off GaN/HEMT power transistors (COTS). Microelectron. Reliab. (2018)
André Durier, Christian Marot, Olivier Crépel
Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model. EMC Compo (2013)
Cécile Weulersse, Florent Miller, Dan Alexandrescu, Erwin Schaefer, Olivier Crépel, Rémi Gaillard
Test methodology of a new upset mechanism induced by protons in deep sub-micron devices. Microelectron. Reliab. 52 (9-10) (2012)
M. Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Microelectron. Reliab. 48 (8-9) (2008)
Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44 (9-11) (2004)
Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43 (9-11) (2003)
Olivier Crépel, C. Goupil, Bernadette Domengès, Philippe Descamps, Philippe Perdu, A. Doukkali
Magnetic field measurements for Non Destructive Failure Analysis. Microelectron. Reliab. 42 (9-11) (2002)
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42 (9-11) (2002)