Patrick Poirier

Publication Activity (10 Years)

Years Active: 2001-2009
Publications (10 Years): 0

Publications

Charles Regard, Christian Gautier, Hélène Frémont, Patrick Poirier, Xiaosong Ma, Kaspar M. B. Jansen
Fast reliability qualification of SiP products. Microelectron. Reliab. 49 (9-11) (2009)
Antoine Reverdy, Philippe Perdu, H. Murray, M. de la Bardonnie, Patrick Poirier
Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology. Microelectron. Reliab. 48 (8-9) (2008)
P. Schwindenhammer, H. Murray, Philippe Descamps, Patrick Poirier
Determination of temperature change inside IC packages during laser ablation of molding compound. Microelectron. Reliab. 48 (8-9) (2008)
Antoine Reverdy, M. de la Bardonnie, Patrick Poirier, H. Murray, Philippe Perdu, A. Boukkali
Dynamic study of the thermal laser stimulation response on advanced technology structures. Microelectron. Reliab. 48 (10) (2008)
D. Abessolo-Bidzo, Patrick Poirier, Philippe Descamps, Bernadette Domengès
Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectron. Reliab. 45 (9-11) (2005)
Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44 (9-11) (2004)
Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps
Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectron. Reliab. 42 (9-11) (2002)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)