Dean Lewis

Publication Activity (10 Years)

Years Active: 2000-2015
Publications (10 Years): 0

Top Topics

Electro Optical

Power Reduction

Modeling Language

Top Venues

Microelectron. Reliab.

Publications

K. Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis
A way to implement the electro-optical technique to inertial MEMS. Microelectron. Reliab. 55 (9-10) (2015)
Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis
A comprehensive study of the application of the EOP techniques on bipolar devices. Microelectron. Reliab. 54 (9-10) (2014)
I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. Microelectron. Reliab. 53 (9-11) (2013)
Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectron. Reliab. 53 (9-11) (2013)
R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis
Effects of 1064 nm laser on MOS capacitor. Microelectron. Reliab. 52 (9-10) (2012)
Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. Microelectron. Reliab. 52 (9-10) (2012)
Guillaume Bascoul, Philippe Perdu, Maryse Béguin, Dean Lewis
High performance thermography with InGaAs photon counting camera. Microelectron. Reliab. 52 (9-10) (2012)
Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. Microelectron. Reliab. 51 (9-11) (2011)
Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. Microelectron. Reliab. 51 (9-11) (2011)
Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis
Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectron. Reliab. 51 (9-11) (2011)
Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. Microelectron. Reliab. 51 (9-11) (2011)
Fulvio Infante, Philippe Perdu, Dean Lewis
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. Microelectron. Reliab. 50 (9-11) (2010)
A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis
CADless laser assisted methodologies for failure analysis and device reliability. Microelectron. Reliab. 50 (9-11) (2010)
Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). Microelectron. Reliab. 50 (9-11) (2010)
C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart
Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectron. Reliab. 49 (9-11) (2009)
Dean Lewis, Nathalie Labat
Editorial. Microelectron. Reliab. 49 (9-11) (2009)
Fulvio Infante, Philippe Perdu, Dean Lewis
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. Microelectron. Reliab. 49 (9-11) (2009)
Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget
Net integrity checking by optical localization techniques. Microelectron. Reliab. 49 (9-11) (2009)
Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier
Generic simulator for faulty IC. Microelectron. Reliab. 48 (8-9) (2008)
M. Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Microelectron. Reliab. 48 (8-9) (2008)
Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. IOLTS (2008)
Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48 (8-9) (2008)
Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis
Identification of process/design issues during 0.18 µm technology qualification for space application. DATE (2007)
Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. 46 (9-11) (2006)
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46 (9-11) (2006)
Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45 (9-11) (2005)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45 (9-11) (2005)
Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectron. Reliab. 45 (9-11) (2005)
Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu
Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS (2005)
Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45 (9-11) (2005)
Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? Microelectron. Reliab. 44 (9-11) (2004)
Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis
Time Resolved Photon Emission Processing Flow for IC Analysis. Microelectron. Reliab. 44 (9-11) (2004)
Vincent Pouget, Dean Lewis, Pascal Fouillat
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. IEEE Trans. Instrum. Meas. 53 (4) (2004)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44 (9-11) (2004)
Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis
Study of the ESD defects impact on ICs reliability. Microelectron. Reliab. 44 (9-11) (2004)
Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis
Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. Microelectron. Reliab. 44 (9-11) (2004)
Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43 (1) (2003)
Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43 (3) (2003)
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectron. Reliab. 43 (9-11) (2003)
G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43 (9-11) (2003)
Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42 (9-11) (2002)
Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectron. Reliab. 42 (9-11) (2002)
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42 (9-11) (2002)
Dean Lewis, Pascal Fouillat, Vincent Pouget
Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. LATW (2002)
Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis
Silicon Thinning and Polishing on Packaged Devices. Microelectron. Reliab. 41 (9-10) (2001)
Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat
A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW (2001)
Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis
Modeling Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)
Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41 (9-10) (2001)
Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner
Theoretical Investigation of an Equivalent Laser LET. Microelectron. Reliab. 41 (9-10) (2001)
Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet
An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW (2000)