Pascal Fouillat

Publication Activity (10 Years)

Years Active: 1997-2009
Publications (10 Years): 0

Publications

Timothée Levi, Jean Tomas, Noëlle Lewis, Pascal Fouillat
A CMOS Resizing Methodology for Analog Circuits. IEEE Des. Test Comput. 26 (1) (2009)
Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. IOLTS (2008)
Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48 (8-9) (2008)
Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. 46 (9-11) (2006)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45 (9-11) (2005)
Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu
Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS (2005)
Vincent Pouget, Dean Lewis, Pascal Fouillat
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. IEEE Trans. Instrum. Meas. 53 (4) (2004)
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44 (9-11) (2004)
Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis
Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. Microelectron. Reliab. 44 (9-11) (2004)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43 (1) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43 (3) (2003)
Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectron. Reliab. 43 (9-11) (2003)
Pascal Fouillat
Laser Utilization for Various Testing Purposes. LATW (2002)
David Deschans, Jean-Baptiste Begueret, Yann Deval, Christophe Scarabello, Pascal Fouillat, Guy Montignac, Alain Baudry
A SiGe 4-Gsps 2-bits digitizer with 2-4 GHz input bandwidth. ICECS (2002)
Anne Spataro, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat
A VLSI CMOS delay oriented waveform converter for polyphase frequency synthesizer. IEEE J. Solid State Circuits 37 (3) (2002)
David Deschans, Jean-Baptiste Bégueret, Yann Deval, Christophe Scarabello, Pascal Fouillat, Guy Montignac, Alain Baudry
A 4 Gsamples/S with 2-4 GHz Input Bandwidth SIGE Digitizer for Radio Astronomy Applications. SBCCI (2002)
Dean Lewis, Pascal Fouillat, Vincent Pouget
Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. LATW (2002)
Anne Spataro, Yann Deval, Jean-Baptiste Bigueret, Pascal Fouillat, Didier Belot
A CMOS VLSI delay oriented waveform converter dedicated to the synthesizer of an UMTS transceiver. CICC (2001)
Jean-Baptiste Bégueret, Yann Deval, Olivier Mazouffre, Anne Spataro, Pascal Fouillat, Eric Benoit, Jean Mendoza
Clock generator using factorial DLL for video applications. CICC (2001)
Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat
A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW (2001)
L. Camino, Serge Ramet, Jean-Baptiste Begueret, Yann Deval, Pascal Fouillat
Phase error determination in GMSK modulated fractional-N PLL. ICECS (2001)
Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41 (9-10) (2001)
Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner
Theoretical Investigation of an Equivalent Laser LET. Microelectron. Reliab. 41 (9-10) (2001)
A. Spataro, Yann Deval, Jean-Baptiste Begueret, Pascal Fouillat
Delay oriented design methodology: application to the design of a VHF low power VLSI polyphase oscillator. ICECS (2000)
Yann Deval, Jean-Baptiste Bégueret, Jean Tomas, Pascal Fouillat
Toward Analog Circuit Synthesis: A Global Methodology Based upon Design of Experiments. SBCCI (2000)
Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet
An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW (2000)
Thomas Zimmer, N. Milet-Lewis, Ahmed Fakhfakh, B. Ardouin, Hervé Levi, J. B. Duluc, Pascal Fouillat
Hierarchical Analogue Design and Behavioural Modelling. MSE (1999)
Yvan Maiden, Barrie W. Jervis, Pascal Fouillat, S. Lesage
Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study. IEEE Trans. Instrum. Meas. 48 (5) (1999)
Jean Tomas, Yann Deval, Jean-Baptiste Begueret, Pascal Fouillat, J. L. Aucouturier
A New Industrial Approach Compatible With Microelectronics Education: Application to an RF System Design. MSE (1999)
Jean Tomas, Yann Deval, Pascal Fouillat, E. Ragbi, Jean Paul Dom, J. L. Aucouturier
Design, integration and characterization of analog integrated circuits: a complete design flow dedicated to microelectronics education. MSE (1997)