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Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.

Thomas BeauchêneDean LewisFelix BeaudoinVincent PougetRomain DesplatsPascal FouillatPhilippe PerduMarise BafleurDavid Trémouilles
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • databases
  • decision trees
  • naive bayes
  • genetic algorithm
  • computer vision
  • similarity measure
  • logistic regression