Romain Desplats

Publication Activity (10 Years)

Years Active: 2001-2006
Publications (10 Years): 0

Publications

Christophe De Nardi, Romain Desplats, Philippe Perdu, Jean-Luc Gauffier, Christophe Guérin
Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectron. Reliab. 46 (9-11) (2006)
C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier
Oxide charge measurements in EEPROM devices. Microelectron. Reliab. 45 (9-11) (2005)
Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu
Failure analysis of micro-heating elements suspended on thin membranes. Microelectron. Reliab. 45 (9-11) (2005)
Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte
Dynamic Laser Stimulation Case Studies. Microelectron. Reliab. 45 (9-11) (2005)
Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectron. Reliab. 45 (9-11) (2005)
Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45 (9-11) (2005)
Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? Microelectron. Reliab. 44 (9-11) (2004)
Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44 (9-11) (2004)
Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis
Time Resolved Photon Emission Processing Flow for IC Analysis. Microelectron. Reliab. 44 (9-11) (2004)
D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectron. Reliab. 44 (9-11) (2004)
Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu
Femtosecond Laser Ablation for Backside Silicon Thinning. Microelectron. Reliab. 44 (9-11) (2004)
Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu
Implementation of TRE systems into Emission Microscopes. Microelectron. Reliab. 44 (9-11) (2004)
Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis
Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. Microelectron. Reliab. 44 (9-11) (2004)
Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43 (3) (2003)
Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43 (9-11) (2003)
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43 (9-11) (2003)
Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43 (9-11) (2003)
Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu
Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectron. Reliab. 43 (9-11) (2003)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah
Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC (2003)
Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42 (9-11) (2002)
Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectron. Reliab. 42 (9-11) (2002)
Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats
IR confocal laser microscopy for MEMS Technological Evaluation. Microelectron. Reliab. 42 (9-11) (2002)
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42 (9-11) (2002)
Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis
Silicon Thinning and Polishing on Packaged Devices. Microelectron. Reliab. 41 (9-10) (2001)
Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis
Modeling Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)
Romain Desplats, Philippe Perdu, Felix Beaudoin
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectron. Reliab. 41 (9-10) (2001)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)