Philippe Descamps

Publication Activity (10 Years)

Years Active: 2002-2024
Publications (10 Years): 4

Top Topics

Smart Environments

Calibration Method

Fish Eye Lenses

Project Management

Top Venues

Integr. Comput. Aided Eng.

Publications

Aymen Ben Hammadi, Mohamed Aziz Doukkali, Philippe Descamps, Constant Niamien
A 26-28 GHz, Two-Stage, Low-Noise Amplifier for Fifth-Generation Radio Frequency and Millimeter-Wave Applications. Sensors 24 (7) (2024)
Kassem Hamze, Daniel Pasquet, Philippe Descamps, Edouard De Ledinghen
Applied TRL Calibration Method to Differential Devices Embedded in a Test Board. RWS (2019)
Insaf Lahbib, Aziz Doukkali, Patrick Martin, Philippe Descamps, Guy Imbert
Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism. IECON (2017)
Philippe Descamps, Vincent Hilaire, Olivier Lamotte, Sebastian Rodriguez
An Experience of Engineering of MAS for Smart Environments: Extension of ASPECS. IIMSS (2016)
Samuel Deniaud, Philippe Descamps, Vincent Hilaire, Olivier Lamotte, Sebastian Rodriguez
An Analysis and Prototyping Approach for Cyber-Physical Systems. FNC/MobiSPC (2015)
Yishuai Lin, Philippe Descamps, Nicolas Gaud, Vincent Hilaire, Abderrafiaa Koukam
Multi-Agent System for intelligent Scrum project management. Integr. Comput. Aided Eng. 22 (3) (2015)
Miled Ben Salah, Daniel Pasquet, Frederic Voiron, Philippe Descamps, Jean Luc Lefebvre, Dominique Lesenechal
Reducing substrate noise coupling in a 3D-PICS Integrated Passive Device by localized P+ guard rings. RWS (2013)
Miled Ben Salah, Daniel Pasquet, Frederic Voiron, Philippe Descamps, Jean Luc Lefebvre, Dominique Lesenechal
Reducing substrate noise coupling in a 3D-PICS Integrated Passive Device by localized P+ guard rings. WiSNet (2013)
Ronald Montesinos, Corinne Berland, Mazen Abi-Hussein, Olivier Venard, Philippe Descamps
power amplifiers in LINC systems. NEWCAS (2012)
Ronald Montesinos, Corinne Berland, Mazen Abi-Hussein, Olivier Venard, Philippe Descamps
Performances of RF PA classes in LINC systems. ISCAS (2012)
P. Schwindenhammer, H. Murray, Philippe Descamps, Patrick Poirier
Determination of temperature change inside IC packages during laser ablation of molding compound. Microelectron. Reliab. 48 (8-9) (2008)
D. Abessolo-Bidzo, Patrick Poirier, Philippe Descamps, Bernadette Domengès
Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectron. Reliab. 45 (9-11) (2005)
Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44 (9-11) (2004)
F. Barbier, Fabrice Blanc, A. Le Grontec, R. Colclaser, Theo Smedes, M. Johnson, Serge Bardy, Philippe Descamps
Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current. Microelectron. Reliab. 44 (9-11) (2004)
Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43 (9-11) (2003)
Olivier Crépel, C. Goupil, Bernadette Domengès, Philippe Descamps, Philippe Perdu, A. Doukkali
Magnetic field measurements for Non Destructive Failure Analysis. Microelectron. Reliab. 42 (9-11) (2002)
Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps
Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectron. Reliab. 42 (9-11) (2002)