Theo Smedes

Publication Activity (10 Years)

Years Active: 2002-2018
Publications (10 Years): 1

Top Topics

Lens Distortion

Conceptual Framework

Top Venues

Microelectron. Reliab.

Publications

Guido Quax, Theo Smedes
An integral injector-victim current transfer model for latchup design rule optimization. IRPS (2018)
Theo Smedes, M. Polewski, A. van IJzerloo, Jean Luc Lefebvre, M. Dekker
Pitfalls for CDM calibration procedures. Microelectron. Reliab. 53 (2) (2013)
Guido Notermans, Dejan M. Maksimovic, Gerd Vermont, Michiel van Maasakkers, Fredrik Pusa, Theo Smedes
On-chip system level protection of FM antenna pin with improved linearity. Microelectron. Reliab. 51 (12) (2011)
Guido Notermans, Theo Smedes, Zeljko Mrcarica, Peter C. de Jong, Ralph Stephan, Hans van Zwol, Dejan M. Maksimovic
ESD protection for thin gate oxides in 65 nm. Microelectron. Reliab. 50 (1) (2010)
Guido Notermans, Olivier Quittard, Anco Heringa, Zeljko Mrcarica, Fabrice Blanc, Hans van Zwol, Theo Smedes, Thomas Keller, Peter C. de Jong
ESD robust high-voltage active clamps. Microelectron. Reliab. 49 (12) (2009)
Theo Smedes
ESD testing of devices, ICs and systems. Microelectron. Reliab. 49 (9-11) (2009)
Dejan M. Maksimovic, Fabrice Blanc, Guido Notermans, Theo Smedes, Thomas Keller
An ESD test reduction method for complex devices. Microelectron. Reliab. 49 (12) (2009)
Theo Smedes, J. de Boet, T. Rödle
Selecting an appropriate ESD protection for discrete RF power LDMOSTs. Microelectron. Reliab. 47 (7) (2007)
M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
A 3-D Circuit Model to evaluate CDM performance of ICs. Microelectron. Reliab. 45 (9-11) (2005)
F. Barbier, Fabrice Blanc, A. Le Grontec, R. Colclaser, Theo Smedes, M. Johnson, Serge Bardy, Philippe Descamps
Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current. Microelectron. Reliab. 44 (9-11) (2004)
T. Wu, Theo Smedes, J. P. Lokker, S.-N. Mei, J. W. Slotboom
A case study of ESD failures at random levels: analysis, explanation and solution. Microelectron. Reliab. 44 (9-11) (2004)
Albert Jan Huitsing, Theo Smedes, H.-U. Schroder
A simple design methodology for increased ESD robustness of CMOS core cells. ESSCIRC (2003)
M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. Microelectron. Reliab. 43 (9-11) (2003)
M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. Microelectron. Reliab. 42 (9-11) (2002)