A 3-D Circuit Model to evaluate CDM performance of ICs.
M. S. B. SowarirajTheo SmedesPeter C. de JongCora SalmTon J. MouthaanFred G. KuperPublished in: Microelectron. Reliab. (2005)
Keyphrases
- computational model
- mathematical model
- high level
- experimental data
- probabilistic model
- artificial intelligence
- network model
- simulation model
- closed form
- theoretical framework
- management system
- prior knowledge
- evolutionary algorithm
- parameter estimation
- input data
- statistical model
- multi agent
- object model
- machine learning