Cora Salm

Publication Activity (10 Years)

Years Active: 2002-2020
Publications (10 Years): 3

Top Topics

Information Technology

Multiresolution

Noisy Observations

Top Venues

Microelectron. Reliab.

Publications

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. IRPS (2020)
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
Towards understanding recovery of hot-carrier induced degradation. Microelectron. Reliab. (2018)
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs. Microelectron. Reliab. (2017)
Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. Microelectron. Reliab. 48 (8-9) (2008)
Arnoud P. van der Wel, Eric A. M. Klumperink, Jay S. Kolhatkar, Eric Hoekstra, Martijn F. Snoeij, Cora Salm, Hans Wallinga, Bram Nauta
Low-Frequency Noise Phenomena in Switched MOSFETs. IEEE J. Solid State Circuits 42 (3) (2007)
Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz
Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectron. Reliab. 47 (4-5) (2007)
Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectron. Reliab. 46 (9-11) (2006)
M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
A 3-D Circuit Model to evaluate CDM performance of ICs. Microelectron. Reliab. 45 (9-11) (2005)
Zhichun Wang, Jan Ackaert, Cora Salm, Fred G. Kuper, Eddy De Backer
Plasma Charging Damage Reduction in IC Processing by A Self-balancing Interconnect. Microelectron. Reliab. 44 (9-11) (2004)
M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. Microelectron. Reliab. 43 (9-11) (2003)
M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. Microelectron. Reliab. 42 (9-11) (2002)
H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper
Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. Microelectron. Reliab. 42 (9-11) (2002)
H. V. Nguyen, Cora Salm, J. Vroemen, J. Voets, Benno Krabbenborg, Jaap Bisschop, A. J. Mouthaan, Fred G. Kuper
Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling. Microelectron. Reliab. 42 (9-11) (2002)