Jurriaan Schmitz

Publication Activity (10 Years)

Years Active: 2006-2023
Publications (10 Years): 4

Top Topics

Transmission Electron Microscopy

Noisy Observations

Gallium Arsenide

Top Venues

Microelectron. Reliab.

Publications

Jelle H. T. Bakker, Mark S. Oude Alink, Jurriaan Schmitz, Bram Nauta
Characterisation of Photodiodes in 22 nm FDSOI at 850 nm. ESSDERC (2023)
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. IRPS (2020)
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
Towards understanding recovery of hot-carrier induced degradation. Microelectron. Reliab. (2018)
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs. Microelectron. Reliab. (2017)
Alessandro Ferrara, Peter G. Steeneken, Boni K. Boksteen, Anco Heringa, A. J. Scholten, Jurriaan Schmitz, Raymond J. E. Hueting
Identifying failure mechanisms in LDMOS transistors by analytical stability analysis. ESSDERC (2014)
Giulia Piccolo, P. I. Kuindersma, L.-Å. Ragnarsson, Raymond J. E. Hueting, Nadine Collaert, Jurriaan Schmitz
Silicon LEDs in FinFET technology. ESSDERC (2014)
Giulia Piccolo, Amir Sammak, Raymond J. E. Hueting, Jurriaan Schmitz, Lis K. Nanver
Role of junction depth in light emission from silicon p-i-n leds. ESSDERC (2013)
Alfons W. Groenland, Elizaveta Vereshchagina, Alexey Y. Kovalgin, Rob A. M. Wolters, J. G. E. Gardeniers, Jurriaan Schmitz
Micro- and nano-link ultra-low power heaters for sensors. ESSDERC (2012)
Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. Microelectron. Reliab. 48 (8-9) (2008)
Guido T. Sasse, Mustafa Acar, Fred G. Kuper, Jurriaan Schmitz
RF CMOS reliability simulations. Microelectron. Reliab. 48 (8-9) (2008)
Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz
Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectron. Reliab. 47 (4-5) (2007)
Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectron. Reliab. 46 (9-11) (2006)