TRANSMISSION ELECTRON MICROSCOPY
Experts
- Andreas K. Maier
- Toby P. Breckon
- Yona Falinie A. Gaus
- Neelanjan Bhowmik
- Shunpei Yamazaki
- Mehdi Moradi
- Nassir Navab
- Masahiro Fujita
- Joy T. Wu
- Michael Ingrisch
- Silke H. Christiansen
- Kiyoshi Kato
- Peter C. Doerschuk
- Georg Schett
- Rick P. Millane
- Peter Fischer
- Volker Rasche
- Joseph Paul Cohen
- Valerio Vignoli
- Atsuo Isobe
- Marco Mugnaini
- Pranav Rajpurkar
- Andreas Maier
- Andrew Y. Ng
- Ge Wang
- Jing Xiao
- Ada Fort
- Joachim Hornegger
- Stephen Rudin
- Arjun Sharma
- Adrian Schwaninger
- Piero Malcovati
- Shun Miao
- Daniel R. Bednarek
- Ichiro Hirosawa
- Ronald M. Summers
- Giuseppe Bertuccio
- Jens Kirchner
- Axel Saalbach
Venues
- CoRR
- Sensors
- Microelectron. Reliab.
- IEEE Access
- OFC
- ISSCC
- ISBI
- IEEE Trans. Medical Imaging
- IEEE J. Solid State Circuits
- IEICE Trans. Electron.
- NEMS
- IBM J. Res. Dev.
- Microelectron. J.
- EMBC
- ISCAS
- Symmetry
- ICTON
- ICIP
- IEEE Trans. Instrum. Meas.
- J. Comput. Chem.
- Medical Imaging: Image Processing
- Comput. Phys. Commun.
- Int. J. Comput. Assist. Radiol. Surg.
- Bildverarbeitung für die Medizin
- IEEE Trans. Biomed. Eng.
- CICC
- ICASSP
- IEICE Electron. Express
- ICECS
- Medical Imaging: Image-Guided Procedures
- VLSI Circuits
- Int. J. Imaging Syst. Technol.
- Comput. Biol. Medicine
- ESSCIRC
- Medical Image Anal.
- Expert Syst. Appl.
- IEEE SENSORS
- J. Imaging
- IEEE Trans. Circuits Syst. II Express Briefs
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