GALLIUM ARSENIDE
Experts
- Kazuhiro Ikeda
- Keren Bergman
- Keijiro Suzuki
- Antonio Núñez
- Roberto Sarmiento
- Hitoshi Kawashima
- Kamran Eshraghian
- Wei Shi
- Amir Nahir
- Laurent Vivien
- Qi Wang
- José Francisco López
- Masahiro Fujita
- Yongqing Huang
- Timo Aalto
- Kenya Suzuki
- Valeria Bertacco
- Richard A. Soref
- Shu Namiki
- Yintang Yang
- Xiaomin Ren
- Hui Huang
- Xiaoguang Tu
- Giacomo Indiveri
- William M. J. Green
- B. El Jani
- Delphine Marris-Morini
- Sabine Cornelsen
- Giovanna Tissoni
- Kiyoshi Asakawa
- Po Dong
- Yoshimasa Sugimoto
- Pierre Labeye
- Chi Xiong
- Peter J. Zampardi
- Qiang Li
- Dimitris Syvridis
- Arokia Nathan
- Wei Wang
Venues
- Microelectron. J.
- OFC
- Microelectron. Reliab.
- Sensors
- IEEE J. Solid State Circuits
- CoRR
- Proc. IEEE
- ICTON
- IEICE Trans. Electron.
- DAC
- IEICE Electron. Express
- IEEE Access
- ISCAS
- ECOC
- Computer
- NEMS
- ITC
- CICC
- IEEE Trans. Instrum. Meas.
- IBM J. Res. Dev.
- OECC/PSC
- IEEE SENSORS
- DATE
- EMBC
- VLSI Design
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- J. Comb. Theory, Ser. B
- Int. J. Bifurc. Chaos
- 3DIC
- IEEE Des. Test
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Trans. Very Large Scale Integr. Syst.
- ICECS
- IEEE Trans. Ind. Electron.
- ISSCC
- SoCC
- ICCD
- IRPS
- ICRA
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