RF CMOS reliability simulations.

Guido T. Sasse Mustafa Acar Fred G. Kuper Jurriaan Schmitz

Published in: Microelectron. Reliab. (2008)

Keyphrases

high speed
low cost
analog vlsi
power consumption
case study
radio frequency
power supply
relevance feedback
numerical simulations
low power
gate dielectrics
reliability analysis
databases
simulation environment
simulation study
software reliability
low voltage
random access memory
infrared
computer vision